The local work function of a surface determines the spatial decay of the charge density at the Fermi level normal to the surface. Here, we present a method that enables simultaneous measurements of local work function and tip-sample forces. A combined dynamic scanning tunneling microscope and atomic force microscope is used to measure the tunneling current between an oscillating tip and the sample in real time as a function of the cantilever's deflection. Atomically resolved work function measurements on a silicon (111)-(7×7) surface are presented and related to concurrently recorded tunneling current- and force- measurements.
@article{arxiv.cond-mat/0501469,
title = {Simultaneous current-, force- and work function measurement with atomic resolution},
author = {M. Herz and Ch. Schiller and F. J. Giessibl and J. Mannhart},
journal= {arXiv preprint arXiv:cond-mat/0501469},
year = {2007}
}
Comments
8 pages, 4 figures, submitted to Applied Physics Letters