Related papers: The lower limit for time resolution in frequency m…
We utilize a homodyne detection technique to achieve a new sensitivity limit for atom-based, absolute radio-frequency electric field sensing of $\mathrm{5 \mu V cm^{-1} Hz^{-1/2} }$. A Mach-Zehnder interferometer is used for the homodyne…
We present the design and experimental results of a near-field scanning microwave microscope (NSMM) working at a frequency of 1GHz. Our microscope is unique in that the sensing probe is separated from the excitation electrode to…
Optical resolution photoacoustic microscopy (OR-PAM) leverages optical focusing and acoustic detection for microscopic optical absorption imaging. Intrinsically it owns high optical lateral resolution and poor acoustic axial resolution.…
Quartz tuning fork-based atomic force microscopy (QTF-AFM) has become a powerful tool for high-resolution imaging of both conductive and insulating samples, including semiconductor structures and metal-coated surfaces as well as soft matter…
The concept and subsequent experimental verification of the proportionality between pulse amplitude and detector transit time for microchannel plate detectors is presented. This discovery has led to considerable improvement in the overall…
We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the…
Piezoelectric nanowires are promising materials for sensing, actuation and energy harvesting, due to their enhanced properties at the nanoscale. However, quantitative characterization of piezoelectricity in nanomaterials is challenging due…
A new technique for the fabrication of highly sensitive qPlus sensor for atomic force microscopy (AFM) is described. Focused ion beam was used to cut then weld onto a bare quartz tuning fork a sharp micro-tip from an electrochemically…
We show that the detection sensitivity of a linear detector is lower bounded by some quantum limits. For the force detection, relevant for atomic force microscopes, the lower bound is given by the so-called ultimate quantum limit. For the…
Atomic force microscopy cantilevers are often, intentionally or not, heated at their extremity. We describe a model to compute the resulting temperature field in the cantilever and in the surrounding fluid on a wide temperature range. In…
Here we obtain analytical expressions for the frequency response of a cantilever beam in the presence of ambient fluid. The advantage of our approach, besides its simplicity of use, is that it explicitly contains the viscosity and the…
Atomic Force Microscopy with SideWall (AFM SW) is widely used for nano-scale surface measurements at side surfaces. In the current study, by taking into consideration the effects of sidewall beam and its probe, an analytical method is…
In this report, we demonstrate a new principle to improve the resolution of the acoustic microscopy, which is based on the sub-wavelength focusing of acoustic wave passing through an acoustically transparent mesoscale particle. In the…
An electro-mechanical setup for the measurement of AC-forces in a low-temperature tunnelling microscope has been developed, which enables extremely high force resolution. The crosstalk of vibrations onto the tunnelling current is used to…
Time-frequency (TF) representation of non-stationary signals typically requires the effective concentration of energy distribution along the instantaneous frequency (IF) ridge, which exhibits intrinsic sparsity. Inspired by the sparse…
Quality factor plays a fundamental role in dynamic mode atomic force microscopy. We present a technique to modify the quality factor of an atomic force microscopy cantilever within a Fabry-P\'erot optical interferometer. The experimental…
The quantitative measurement of viscoelasticity of nano-scaleentities is an important goal of nanotechnology research and there is considerable progress with advent of dynamic Atomic Force Microscopy. The hydrodynamics of cantilever, the…
Atomic force microscopy is based on tip sample interaction, which is determined by the properties of tip and sample. Unfortunately, in particular in ambient conditions the tip as well as the sample are contaminated, and it is not clear how…
Pulse tube refrigerators are becoming more common, because they are cost efficient and demand less handling than conventional (wet) refrigerators. However, a downside of a pulse tube system is the vibration level at the cold-head, which is…
Nonlinear interferometers that replace beamsplitters in Mach-Zehnder interferometers with nonlinear amplifiers for quantum-enhanced phase measurements have drawn increasing interest in recent years, but practical quantum sensors based on…