Related papers: Interference-aided spectrum fitting method for acc…
It is generally believed that any particle to be discovered will have a TeV-order mass. Given its great mass, it must have a large decay width. Therefore, the interference effect will be very common if they and the Standard-Model (SM)…
With the development of terahertz time-domain spectroscopy, methods have been proposed to precisely estimate the thickness, refractive index, and attenuation coefficient of a sample. In this article, we propose a new method to compute these…
The unambiguous and universal determination of optical constants such as complex refractive indices (n, k) and thickness (d) in one measurement is typically confined for films with a thickness of more than 10~nm that hampers its application…
This paper presents a method for determination of interference filter parameters such as the effective refraction index and the maximal transmittance wavelength on the basis of image processing of a spectrogram produced by Spectrometer…
The inclusion of material identification in wireless communication system is an emerging area that offers many opportunities for 6G systems. By using reflected radio wave to determine the material of reflecting surface, not only the…
Sample thickness is an important parameter in transmission electron microscopy (TEM) imaging, for interpreting image contrast and understanding the relationship between properties and microstructure. In this study, we introduce a method for…
Optical spectroscopy is a fundamental tool in numerous areas of science and technology. Much effort has focused on miniaturizing spectrometers, but thus far at the cost of high spectral resolution and broad operating range. Here, we…
Optical interference is not only a fundamental phenomenon that has enabled new theories of light to be derived but it has also been used in interferometry for the measurement of small displacements, refractive index changes and surface…
A simple, non-invasive method using Raman spectroscopy for the estimation of the thickness of graphene layers grown epitaxially on silicon carbide (SiC) is presented, enabling simultaneous determination of thickness, grain size and disorder…
Grazing incidence x-ray scattering provides nanostructural information for thin film samples, but single images generally do not provide information on film thickness or the full complex index of refraction. Additionally, for thin films…
We present a new imaging technique, swept-angle synthetic wavelength interferometry, for full-field micron-scale 3D sensing. As in conventional synthetic wavelength interferometry, our technique uses light consisting of two…
Long baseline diffraction-limited optical aperture synthesis technology by interferometry plays an important role in scientific study and practical application. In contrast to amplitude (phase) interferometry, intensity interferometry --…
We theorize the surface step characterization by reflected incoherent-light differential interference microscopy with consideration of the optical diffraction effect. With the integration of localization analysis, we develop a quantitative…
This paper introduces a practical and accurate calibration method for camera spectral sensitivity using a diffraction grating. Accurate calibration of camera spectral sensitivity is crucial for various computer vision tasks, including color…
A novel and simple approach to optical wavelength measurement is presented in this paper. The working principle is demonstrated using a tunable waveguide micro ring resonator and single photodiode. The initial calibration is done with a set…
Reducing device volume is one of the key requirements for advanced nanophotonic technologies, however this demand is often at odds with designing highly absorbing elements which usually require sizeable thicknesses, such as for detector and…
The development of optical fibers has revolutionized telecommunications by enabling long-distance broad-band transmission with minimal loss. In turn, the ubiquity of high-quality low-cost fibers enabled a number of additional applications,…
We propose atomic films of n-doped $\gamma$-InSe as a platform for intersubband optics in the infrared (IR) and far infrared (FIR) range, coupled to out-of-plane polarized light. Depending on the film thickness (number of layers) of the…
The reliable operation of micro and nanomechanical devices necessitates a thorough knowledge of the water film thickness present on the surfaces of these devices with an accuracy in the nm range. In this work, the thickness of an ultra-thin…
The optical absorption of nanoscale thickness semiconductor films on top of light-trapping structures based on optical interference effects combined with spectrum-splitting structures is theoretically investigated. Nearly perfect absorption…