Related papers: Interference-aided spectrum fitting method for acc…
We demonstrate theoretically and experimentally how the diffraction and interferometric resolution limit for single-mode coherent cw laser light can be overcome by multi-photon interference. By use of a Mach-Zehnder interferometer, operated…
We propose methods to perform intensity interferometry of photons having two different wavelengths. Distinguishable particles typically cannot interfere with each other, but we overcome that obstacle by processing the particles via…
For the radiofrequency (RF) applications of normal conducting film with large mean free path at high frequency and low temperature, the anomalous skin effect differs considerably from the normal skin effect with field decaying exponentially…
We describe an all-fiber nonlinear interferometer based on four-wave mixing in highly nonlinear fiber. Our configuration realizes phase-sensitive interference with 97% peak visibility and >90% visibility over a broad 554 GHz optical band.…
An accurate determination of specimen thickness is essential for quantitative analytical electron microscopy. Here we demonstrate that a position-averaged incoherent bright-field signal recorded on an absolute scale can be used to determine…
The analytic expressions for the maximum and minimum reflectance of optical films coated with gapped graphene are derived in the application region of the Dirac model with account of multiple reflections. The respective film thicknesses are…
We present the use of a commercially available fixed-angle multi-wavelength ellipsometer for quickly measuring the thickness of NbN thin films for the fabrication and performance improvement of superconducting nanowire single photon…
Finite-thickness effects are analyzed theoretically for the plasma frequency and associated dielectric response function of plasmonic films formed by periodically aligned, infinitely thin, identical metallic cylinders. The plasma frequency…
Microscopes and various forms of interferometers have been used for decades in optical metrology of objects that are typically larger than the wavelength of light {\lambda}. However, metrology of subwavelength objects was deemed impossible…
White-light interferometry is one of today's most precise tools for determining optical material properties. Achievable precision and accuracy are typically limited by systematic errors due to a high number of interdependent data fitting…
In transmission-mode terahertz time-domain spectroscopy (THz-TDS), the thickness of a sample is a critical factor that determines an amount of the interaction between terahertz waves and bulk material. If the interaction length is too…
Atomic force microscopy (AFM) is one of the most promising methods for investigating the structure of materials at the micro and nanoscale levels, as well as their local physical-mechanical properties. The experimental data obtained with…
We present an analytical description and an experimental realization of interscale mixing microscopy, a diffraction-based imaging technique that is capable of detecting wavelength/10 objects in far-field measurements with both coherent and…
I very briefly describe the latest generation near infrared (1-2.5 micron) instruments which are available on, or under development for `large' (D>=3.5 m) telescopes. Most of the imagers under construction are limited to relatively small…
Mid-infrared photothermal microscopy is a new chemical imaging technology in which a visible beam senses the photothermal effect induced by a pulsed infrared laser. This technology provides infrared spectroscopic information at sub-micron…
The Multi-Layer Thin Films Problem is a materials science problem that aims to enhance the reflectance of a metallic substrate by designing multi-layer coatings composed of different dielectric materials and thicknesses. While previous…
Far-field characterization of small objects is severely constrained by the diffraction limit. Existing tools achieving sub-diffraction resolution often utilize point-by-point image reconstruction via scanning or labelling. Here, we present…
The contrast formation mechanism in Nanoscale Infrared Spectroscopy (Nano-IR or AFM-IR) is analyzed for the boundary between two layers with different light absorption, thermal and elastic parameters. Analytical results derived in the…
Optical stellar interferometers have demonstrated milli-arcsecond resolution with few apertures spaced hundreds of meters apart. To obtain rich direct images, many apertures will be needed, for a better sampling of the incoming wavefront.…
The optical interferometry has been widely used in various high precision applications. Usually, the minimum precision of an interferometry is limited by various technique noises in practice. To suppress such kind of noises, we propose a…