Related papers: Interference-aided spectrum fitting method for acc…
Highly flexible electromagnetic interference (EMI) shielding material with excellent shielding performance is of great significance to practical applications in next-generation flexible devices. However, most EMI materials suffer from…
Thickness uniformity is regarded as an important parameter in designing thin film devices. However, some applications based on films with non-uniform thickness have recently emerged, such as gas sensors and optimized materials based on the…
In this work, we present a technique to determine the mid-infrared refractive indices of thin superconducting films using Fourier transform infrared spectroscopy (FTIR). In particular, we performed FTIR transmission and reflection…
The determination of density profiles with knowing the phase information of complex reflection coefficient for neutron specularly reflected from a film, yields unique results. Recently it has been shown that the phase can be determined by…
We have built a Terahertz Dispersive Fourier Transform Spectrometer \cite{Birch1987} to study frequency properties of superconducting films used for fabrication of THz detectors. The signal reflected from the tested film is measured in time…
We report on the design of an all-mirror wavefront-division interferometer capable of spectroscopic studies across multiple spectral ranges$\unicode{x2013}$from the plasma frequencies of metals to terahertz wavelengths and beyond. The…
A fundamental parameter to determine how electromagnetic waves interfere is their relative phase. Therefore, achieving a fine control over it enables a wide range of interferometric applications. Existing phase control methods rely on…
For measurements designed to accurately determine layer thickness, there is a natural trade-off between sensitivity to optical thickness and lateral resolution due to the angular ray distribution required for a focused beam. We demonstrate…
Mid-infrared photo-induced force microscopy (IR-PiFM/PiF-IR) enables high-resolution chemical imaging of surfaces with lateral resolution less than 5 nm. Here are some answers to questions about the physical background, practical handling…
Many adaptive optics systems operate by measuring the distortion of the wavefront in one wavelength range and performing the scientific observations in a second, different wavelength range. One common technique is to measure wavefront…
We demonstrate a new approach to classical fiber-fed spectroscopy. Our method is to use a photonic lantern that converts an arbitrary (e.g. incoherent) input beam into N diffraction-limited outputs. For the highest throughput, the number of…
Absorption of microwave by metallic conductors is exclusively inefficient, though being natively broadband, due to the huge impedance mismatch between metal and free space. Reducing the thickness to ultrathin conductive film may improve the…
We present a new method, called "forced-spectrum fitting", for physically-based spectral modelling of radio sources during deconvolution. This improves upon current common deconvolution fitting methods, which often produce inaccurate…
One common task in image forensics is to detect spliced images, where multiple source images are composed to one output image. Most of the currently best performing splicing detectors leverage high-frequency artifacts. However, after an…
The resolution limits of classical spectroscopy can be surpassed by quantum-inspired methods leveraging the information contained in the phase of the complex electromagnetic field. Their counterpart in spatial imaging has been widely…
Multiple scattering of waves in disordered media is a nightmare whether it be for detection or imaging purposes. The best approach so far to get rid of multiple scattering is optical coherence tomography. It basically combines confocal…
Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect depth information about features on the top atomic layer of samples. By combining secondary ion mass spectroscopy (SIMS) with focused ion beam…
A new method for dark field imaging is introduced which uses scanned electron diffraction (or 4DSTEM - 4-dimensional scanning transmission electron microscopy) datasets as its input. Instead of working on simple summation of intensity, it…
There are many applications involving the use of bismuth antimony thin films. However, due to the low crystalline symmetry and strong coupling between the electronic band edges, it has always been challenging to infer the electronic phase…
High-precision measurements implemented by means of light is desired in all fields of science. However, light is a wave and Rayleigh criterion gives us a diffraction limitation in classical optics which restricts to get arbitrary high…