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Related papers: X-Ray diffraction on large single crystals using a…

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In ultrafast electron diffraction (UED) experiments, accurate retrieval of time-resolved structural parameters, such as atomic coordinates and thermal displacement parameters, requires an accurate scattering model. Unfortunately,…

Materials Science · Physics 2023-01-03 Daniel B. Durham , Colin Ophus , Khalid M. Siddiqui , Andrew M. Minor , Daniele Filippetto

We report fabrication and results of high-resolution X-ray topography characterization of diamond single crystal plates with a large surface area (10$\times$10 mm$^2$) and (111) crystal surface orientation for applications in high-heat-load…

Instrumentation and Detectors · Physics 2016-05-16 S. Stoupin , S. Antipov , J. E. Butler , A. V. Kolyadin , A. Katrusha

The objective of this article is to study the behavior of electromagnetic field under X-ray diffraction by time-dependent deformed crystals. Derived system of differential equations looks like the Takagi equations in the case of…

Computational Physics · Physics 2007-05-23 Svetlana Sytova

X-ray diffractometers primarily designed for surface x-ray diffraction are often used to measure the diffraction from powders, textured materials, and fiber-texture samples in so-called $2\theta$ scans. Unlike high-energy powder diffraction…

Applied Physics · Physics 2022-01-27 Giuseppe Abbondanza , Alfred Larsson , Francesco Carlá , Edvin Lundgren , Gary S. Harlow

The imaging problem of a specular reflector is revisited. Retaining terms through second order in the reflector surface expansion, we derive the form of the aberration-limiting aperture for arbitrary magnification assuming no bandwidth…

Optics · Physics 2026-03-30 Stanislav Stoupin , David Sagan

Coherent X-ray photons with energies higher than 50 keV offer new possibilities for imaging nanoscale lattice distortions in bulk crystalline materials using Bragg peak phase retrieval methods. However, the compression of reciprocal space…

Signal Processing · Electrical Eng. & Systems 2018-08-14 Siddharth Maddali , Irene Calvo-Almazan , Jonathan Almer , Peter Kenesei , Jun-Sang Park , Ross Harder , Youssef Nashed , Stephan Hruszkewycz

The resolution function of a spectrometer based on a strongly bent single crystal (bending radius of 10 cm or less) is evaluated. It is shown that the resolution is controlled by two parameters, (i) the ratio of the lattice spacing of the…

Instrumentation and Detectors · Physics 2020-09-21 Vladimir Kaganer , Ilia Petrov , Liubov Samoylova

We study X-ray diffraction in smectic liquid crystal multilayers. Such systems are fabricated as freely suspended films and have a unique layered structure. As such, they can be described as organic Bragg mirrors with sub-nanometer…

Soft Condensed Matter · Physics 2025-10-15 V. V. Samsonov , K. V. Nikolaev , B. I. Ostrovskii , S. N. Yakunin

Thick diffractive optical elements offer a promising way to achieve focusing or imaging at a resolution approaching 1 nm for X-ray wavelengths shorter than about 0.1 nm. Efficient focusing requires that these are fabricated with structures…

Optics · Physics 2020-12-02 Henry N. Chapman , Saša Bajt

In this paper we investigate x-ray and $\gamma$-ray propagation in crystals having a constant strain gradient and flat or cylindrical surfaces. When a displacement field is present, we solve the Takagi-Taupin equations either by the…

Instrumentation and Detectors · Physics 2008-09-17 A. Apolloni , G. Mana , C. Palmisano , G. Zosi

The resolution of X-ray diffraction microscopy is limited by the maximum dose that can be delivered prior to sample damage. In the proposed Serial Crystallography method, the damage problem is addressed by distributing the total dose over…

Focused ion beam (FIB) techniques are commonly used to machine, analyse and image materials at the micro- and nanoscale. However, FIB modifies the integrity of the sample by creating defects that cause lattice distortions. Methods have been…

Materials Science · Physics 2021-03-05 David Yang , Nicholas W. Phillips , Kay Song , Ross J. Harder , Wonsuk Cha , Felix Hofmann

Dynamical diffraction effects in single crystals produce highly monochromatic parallel X-ray beams with a mutual separation of a few micrometer and a time-delay of a few fs -the so-called echoes. This ultrafast diffraction effect is used at…

X-ray single particle imaging involves the measurement of a large number of noisy diffraction patterns of isolated objects in random orientations. The missing information about these patterns is then computationally recovered in order to…

Image and Video Processing · Electrical Eng. & Systems 2020-05-25 Kartik Ayyer

Determining the atomic-level structure of crystalline solids is critically important across a wide array of scientific disciplines. The challenges associated with obtaining samples suitable for single-crystal diffraction, coupled with the…

Ultrafast nanocrystallography has the potential to revolutionize biology by enabling structural elucidation of proteins for which it is possible to grow crystals with 10 or fewer unit cells on the side. The success of nanocrystallography…

Optics · Physics 2012-09-24 F. R. N. C. Maia , C. Yang , S. Marchesini

The measurement of the silicon lattice parameter by a separate-crystal triple-Laue x-ray interferometer is a key step for the kilogram realisation by counting atoms. Since the measurement accuracy is approaching nine significant digits, a…

Optics · Physics 2022-02-17 Carlo P. Sasso , Giovanni Mana , Enrico Massa

We demonstrate near-atomic-resolution Bragg diffraction from aerosolized single granulovirus crystals using an x-ray free-electron laser. The form of the aerosol injector is nearly identical to conventional liquid-microjet nozzles, but the…

Precise lattice parameter measurements in single crystals are achievable, in principle, by X-ray multiple diffraction (MD) experiments. Tiny sample misalignments can compromise systematic usage of MD in studies where accuracy is an…

Materials Science · Physics 2007-05-23 S. L. Morelhão , L. H. Avanci , R. Freitas , A. A. Quivy

High angular resolution electron backscatter diffraction (HR-EBSD) affords an increase in angular resolution, as compared to 'conventional' Hough transform based EBSD, of two orders of magnitude, enabling measurements of relative…

Instrumentation and Detectors · Physics 2017-10-03 T Ben Britton , James L R Hickey
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