Imaging ultrafast dynamical diffraction wavefronts in strained Si with coherent X-rays
Optics
2021-10-13 v2 Materials Science
Applied Physics
Instrumentation and Detectors
Abstract
Dynamical diffraction effects in single crystals produce highly monochromatic parallel X-ray beams with a mutual separation of a few micrometer and a time-delay of a few fs -the so-called echoes. This ultrafast diffraction effect is used at X-ray Free Electron Lasers in self-seeding schemes to improve beam monochromaticity. Here, we present a coherent X-ray imaging measurement of echoes from Si crystals and demonstrate that a small surface strain can be used to tune their temporal delay. These results represent a first step towards the ambitious goal of strain-tailoring new X-ray optics.
Cite
@article{arxiv.2012.08893,
title = {Imaging ultrafast dynamical diffraction wavefronts in strained Si with coherent X-rays},
author = {Angel Rodriguez-Fernandez and Ana Diaz and Anand H. S. Iyer and Mariana Verezhak and Klaus Wakonig and Magnus H. Colliander and Dina Carbone},
journal= {arXiv preprint arXiv:2012.08893},
year = {2021}
}