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Related papers: Thickness Measurements from Single X-ray Phase-con…

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The phase structure function accumulated by two parallel rays after transmission through a layer of turbulent air is best known by a proportionality to the 5/3rd power of the lateral distance in the aperture, derived from an isotropic…

Instrumentation and Methods for Astrophysics · Physics 2011-03-01 Richard J. Mathar

Propagation-based X-ray phase contrast enables nanoscale imaging of biological tissue by probing not only the attenuation, but also the real part of the refractive index of the sample. Since only intensities of diffracted waves can be…

Numerical Analysis · Mathematics 2017-09-11 Simon Maretzke , Thorsten Hohage

We have implemented three different optical methods to quantitatively assess the thickness of thin GaSe flakes transferred on both transparent substrates, like Gel-Film, or SiO2/Si substrates. We show how their apparent color can be an…

Single-pixel imaging (SPI) exhibits cost-effectiveness, broad spectrum, and stable sub-Nyquist sampling reconstruction, enabling applications across diverse imaging fields.However, due to the inherent reconstruction mechanism, SPI is not…

Optics · Physics 2025-04-18 Shao Chongwu , Cao Yue , Zhao Qing , Yao Xuri

Radiation of a charged particle moving parallel to a inhomogeneous surface is considered. Within a single formalism periodic and random gratings are examined. For the periodically inhomogeneous surface we derive new expressions for the…

Accelerator Physics · Physics 2010-10-12 Zh. S. Gevorkian

This paper is concerned with inverse scattering of plane waves by a locally perturbed infinite plane (which is called a locally rough surface) with the modulus of the total-field data (also called the phaseless near-field data) at a fixed…

Numerical Analysis · Mathematics 2018-08-28 Xiaoxu Xu , Bo Zhang , Haiwen Zhang

Coherent surface scattering imaging (CSSI) is an emerging experimental technique uniquely suited to probing the structure of thin nanostructures. In these experiments, a specimen is placed on a substrate, and a series of X-ray diffraction…

Computational Physics · Physics 2026-04-22 Jeffrey J. Donatelli , Miaoqi Chu , Zixi Hu , Zhang Jiang , Nicholas Schwarz , Jin Wang , James A. Sethian

Quantitative phase imaging has become a topic of considerable interest in the microscopy community. We have recently described one such technique based on the use of a partitioned detection aperture, which can be operated in a single shot…

Optics · Physics 2015-10-20 Roman Barankov , Jean-Charles Baritaux , Jerome Mertz

A method for quantitative estimation of density in a high-speed flow field is presented, which uses a structured-light beam probe to interrogate the region of interest (ROI). Wavefront distortion suffered by the interrogating beam as it…

Optics · Physics 2022-02-09 Biswajit Medhi , K. P. J. Reddy

We introduce a single-frame diffractive imaging method called randomized probe imaging (RPI). In RPI, a sample is illuminated by a structured probe field containing speckles smaller than the sample's typical feature size. Quantitative…

In the hard X rays domain, the phase shift of the wave passing through the soft materials like tissues is typically three orders of magnitude larger than the absorption. Therefore the phase-sensitive X-ray imaging methods can obtain…

Instrumentation and Detectors · Physics 2018-06-12 Lian Chen , Rongqi Sun , Ge Jin

There are two main physical properties needed to fabricate 1D photonic structures and form perfect photonic bandgaps: the quality of the thickness periodicity and the refractive index of their components. Porous silicon (PS) is a…

Optics · Physics 2022-09-14 Denise Estrada-Wisese , J. Antonio del Rio

The diffraction of electromagnetic plane waves by a rectangular grating formed by discrete steps in the interface of a homogeneous, isotropic, linear, negative phase--velocity (negative index) material with free space is studied using the…

Optics · Physics 2009-11-11 Ricardo A. Depine , Akhlesh Lakhtakia , David R. Smith

For measurements designed to accurately determine layer thickness, there is a natural trade-off between sensitivity to optical thickness and lateral resolution due to the angular ray distribution required for a focused beam. We demonstrate…

The depth dependence of crystalline structure within thin films is critical for many technological applications, but has been impossible to measure directly using common techniques. In this work, by monitoring diffraction peak intensity and…

Applied Physics · Physics 2018-05-24 Eliot Gann , Mario Caironi , Yong-Young Noh , Yun-Hi Kim , Christopher R. McNeill

The imaging sharpness of an X-ray telescope is chiefly determined by the optical quality of its focusing optics, which in turn mostly depends on the shape accuracy and the surface finishing of the grazing-incidence X-ray mirrors that…

Instrumentation and Methods for Astrophysics · Physics 2014-12-10 Lorenzo Raimondi , Daniele Spiga

Differential phase contrast interior tomography allows for reconstruction of a refractive index distribution over a region of interest (ROI) for visualization and analysis of internal structures inside a large biological specimen. In this…

Medical Physics · Physics 2015-05-30 Wenxiang Cong , Ge Wang

Classical reconstruction methods for phase-contrast tomography consist of two stages: phase retrieval and tomographic reconstruction. A novel algebraic method combining the two was suggested by Kostenko et al. (Opt. Express, 21, 12185,…

Numerical Analysis · Computer Science 2015-09-08 Rasmus Dalgas Kongskov , Jakob Sauer Jørgensen , Henning Friis Poulsen , Per Christian Hansen

We study a class of high-frequency path functionals for diffusions with singular thresholds or boundaries, where the process exhibits either (i) skweness, oscillating coefficients, and stickiness, or (ii) sticky reflection. The functionals…

Probability · Mathematics 2025-09-16 Alexis Anagnostakis , Sara Mazzonetto

The rigid-intensity-shift model of differential phase contrast scanning transmission electron microscopy (DPC-STEM) imaging assumes that the phase gradient imposed on the probe by the sample causes the diffraction pattern intensity to shift…

Instrumentation and Detectors · Physics 2018-04-25 L. Clark , H. G. Brown , D. M. Paganin , M. J. Morgan , T. Matsumoto , N. Shibata , T. C. Petersen , S. D. Findlay