Related papers: Thickness Measurements from Single X-ray Phase-con…
We consider the inverse problem of determining the geometry of penetrable objects from scattering data generated by one incident wave at a fixed frequency. We first study an orthogonality sampling type method which is fast, simple to…
We propose an imaging system and methodology for mapping soft-tissue samples in three dimensions, with micron-scale and isotropic spatial resolution, with low-concentrations as well as in the absence of heavy metal staining. We used hard…
Pump-probe time-resolved x-ray diffraction of allowed and nearly forbidden reflections in InSb is used to follow the propagation of a coherent acoustic pulse generated by ultrafast laser-excitation. The surface and bulk components of the…
A method for direct phase difference reconstruction using single-shot dual-wavelength off-axis digital holography is presented. This approach enables direct imaging of samples with high steps without the need to reconstruct phase images at…
X-ray microtomography is a versatile tool allowing the measurement of the 3D structure of optically thick samples. As a non-destructive technique, it is readily adapted to 4D imaging, where a sample can be monitored over time, and…
The kinetic energy of an atom recoiling due to absorption of a photon was measured as a frequency using an interferometric technique called ``contrast interferometry''. Optical standing wave pulses were used as atom-optical elements to…
When a solid plate is withdrawn from a partially wetting liquid, a liquid layer dewets the moving substrate. High-speed imaging reveals alternating thin and thick regions in the entrained layer in the transverse direction at steady state.…
In astronomy or biological imaging, refractive index inhomogeneities of e.g. atmosphere or tissues induce optical aberrations which degrade the desired information hidden behind the medium. A standard approach consists in measuring these…
We demonstrate an optical scheme for measuring the thickness of thin nanolayers with the use of light beam s spatial modes. The novelty in our scheme is the projection of the beam reflected by the sample onto a properly-tailored spatial…
We demonstrate the feasibility of obtaining accurate pair distribution functions of thin amorphous films down to 80 nm, using modern laboratory-based x-ray sources. The pair distribution functions are obtained using a single diffraction…
In this paper, we propose the SPR (sparse phase retrieval) method, which is a new phase retrieval method for coherent x-ray diffraction imaging (CXDI). Conventional phase retrieval methods effectively solve the problem for high…
We outline some basics of imaging using both fully-coherent and partially-coherent X-ray beams, with an emphasis on phase-contrast imaging. We open with some of the basic notions of X-ray imaging, including the vacuum wave equations and the…
When x-rays penetrate soft matter, their phase changes more rapidly than their amplitude. In- terference effects visible with high brightness sources creates higher contrast, edge enhanced images. When the object is piecewise smooth (made…
A method is proposed for obtaining three simultaneous projections of a target from a single radiation pulse, which also allows the relative orientation of successive targets to be determined. The method has application to femtosecond X-ray…
We present a novel approach to single-shot characterization of the spectral phase of broadband laser pulses. Our method is inexpensive, insensitive to alignment and combines the simplicity and robustness of the dispersion scan technique,…
The refractive index (RI) of cells and tissues is crucial in pathophysiology as a noninvasive and quantitative imaging contrast. Although its measurements have been demonstrated using three-dimensional quantitative phase imaging methods,…
We show that an arbitrary spatial distribution of complex refractive index inside an object can be exactly represented as a sum of two "monomorphous" complex distributions, i.e. the distributions with the ratios of the real part to the…
In semiconductor manufacturing processes, silicon dioxide films are commonly used as barrier layers, insulating layers, and protective layers. Coherence scanning interferometry (CSI) offers thin film thickness measurements with a…
We report the initial demonstrations of the use of single crystals in indirect x-ray imaging for x-ray phase contrast imaging at the Washington University in St. Louis Computational Bioimaging Laboratory (CBL). Based on single Gaussian peak…
Recently introduced speckle-correlations based techniques enable noninvasive imaging of objects hidden behind scattering layers. In these techniques the hidden object Fourier amplitude is retrieved from the scattered light autocorrelation,…