Single-frame far-field diffractive imaging with randomized illumination
Abstract
We introduce a single-frame diffractive imaging method called randomized probe imaging (RPI). In RPI, a sample is illuminated by a structured probe field containing speckles smaller than the sample's typical feature size. Quantitative amplitude and phase images are then reconstructed from the resulting far-field diffraction pattern. The experimental geometry of RPI is straightforward to implement, requires no near-field optics, and is applicable to extended samples. When the resulting data are analyzed with a complimentary algorithm, reliable reconstructions which are robust to missing data are achieved. To realize these benefits, a resolution limit associated with the numerical aperture of the probe-forming optics is imposed. RPI therefore offers an attractive modality for quantitative X-ray phase imaging when temporal resolution and reliability are critical but spatial resolution in the tens of nanometers is sufficient. We discuss the method, introduce a reconstruction algorithm, and present two proof-of-concept experiments: one using visible light, and one using soft X-rays.
Cite
@article{arxiv.2010.02948,
title = {Single-frame far-field diffractive imaging with randomized illumination},
author = {Abraham L. Levitan and Kahraman Keskinbora and Umut T. Sanli and Markus Weigand and Riccardo Comin},
journal= {arXiv preprint arXiv:2010.02948},
year = {2020}
}