Related papers: X-ray diffraction microscopy based on refractive o…
Single-crystal X-ray diffraction (SC-XRD) is the gold standard technique to characterize crystal structures in solid state. Despite significant advances in automation for structure solution, the refinement stage still depends heavily on…
Material properties strongly depend on the nature and concentration of defects. Characterizing these features may require nano- to atomic-scale resolution to establish structure-property relationships. 4D-STEM, a technique where diffraction…
We introduce a single-frame diffractive imaging method called randomized probe imaging (RPI). In RPI, a sample is illuminated by a structured probe field containing speckles smaller than the sample's typical feature size. Quantitative…
The diffraction of stochastic point sets, both Bernoulli and Markov, and of random tilings with crystallographic symmetries is investigated in rigorous terms. In particular, we derive the diffraction spectrum of 1D random tilings, of…
The challenge of imaging low-density objects in an electron microscope without causing beam damage is significant in modern TEM. This is especially true for life science imaging, where the sample, rather than the instrument, still…
Chromatic aberration in optical systems arises from the wavelength dependence of a glass's refractive index. Polychromatic rays incident upon an optical surface are refracted at slightly different angles and in traversing an optical system…
Coherent diffraction imaging is a high-resolution imaging technique whose potential can be greatly enhanced by applying the extrapolation method presented here. We demonstrate enhancement in resolution of a non-periodical object…
This article presents a method to perform diffraction tomography in a standard microscope that includes an LED array for illumination. After acquiring a sequence of intensity-only images of a thick sample, a ptychography-based…
Conventional X-ray methods use incoming plane waves and result in discrete diffraction patterns when scattered at crystals. Here we find, by a systematic method, incoming waveforms which exhibit discrete diffraction patterns when scattered…
We report the first demonstration of wrinkled membranes as a kind of optical focusing devices, which are low cost, light weight and flexible. Our device consists of concentric wrinkle rings on a gold-PDMS bilayer membrane, which converts…
Many optical approaches have been used to examine the composition and structure of gemstones, both recently and throughout history. The nonlinear optical behavior of different gemstones has not been investigated, and the higher order terms…
In a previous paper, we reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. We here show experimental applications of the technique for characterising both refractive and…
Negative refraction is known to occur in materials that simultaneously possess a negative electric permittivity and magnetic permeability; hence they are termed negative index materials. However, there are no known natural materials that…
Convergent beam electron diffraction (CBED) performed on two-dimensional (2D) materials recently emerged as a powerful tool to study structural and stacking defects, adsorbates, atomic 3D displacements in the layers, and the interlayer…
With the advent of microsphere assisted microscopy in 2011, this technique emerged as a simple and easy way to obtain optical super-resolution. Although the possible mechanisms of imaging by microspheres are debated in the literature, most…
A shearing interferometer is presented which uses polarization control to shear the wavefront and to modulate the interference pattern. The shear is generated by spatial walk-off in a birefringent crystal. By adjusting the orientation of…
We used a microfluidic platform to address the problems of obtaining diffraction quality crystals and crystal handling during transfer to the X-ray diffractometer. We optimize crystallization conditions of a pharmaceutical protein and…
Far-field characterization of small objects is severely constrained by the diffraction limit. Existing tools achieving sub-diffraction resolution often utilize point-by-point image reconstruction via scanning or labelling. Here, we present…
In the paper, we explain an automated LabVIEW controlled setup that enables interferometric measurements of refractive indices in crystalline materials using a laser light source. The setup combines a mechanical system, a…
Quantitative measurements of extended defects in crystalline materials are important in understanding material behaviour. X-ray line profile analysis provides a complement to direct counting in the electron microscope, but is an indirect…