X-ray optics and beam characterisation using random modulation: Experiments
Instrumentation and Detectors
2020-02-24 v1 Optics
Abstract
In a previous paper, we reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. We here show experimental applications of the technique for characterising both refractive and reflective optical components. These fast and accurate X-ray at-wavelength metrology methods can assist the manufacture of X-ray optics that transport X-ray beams with minimum amount of wavefront distortion. We also recall how such methods can facilitate online optimization of active optics.
Cite
@article{arxiv.1912.05432,
title = {X-ray optics and beam characterisation using random modulation: Experiments},
author = {Sebastien Berujon and Ruxandra Cojocaru and Pierre Piault and Rafael Celestre and Thomas Roth and Raymond Barrett and Eric Ziegler},
journal= {arXiv preprint arXiv:1912.05432},
year = {2020}
}
Comments
13 pages, 13 figures. arXiv admin note: substantial text overlap with arXiv:1902.09418