X-ray optics and beam characterization using random modulation: Theory
Optics
2020-03-04 v4 Applied Physics
Abstract
X-ray near-field speckle-based phase-sensing approaches provide efficient means to characterise optical elements. Here, we present a theoretical review of several of these speckle methods in the frame of optical characterisation and provide a generalization of the concept. As we also demonstrate experimentally in another paper, the methods theoretically developed here can be applied with different beams and optics and within a variety of situations where at-wavelength metrology is desired. By understanding the differences between the various processing methods, it is possible to find and implement the best suited approach for each metrology scenario.
Cite
@article{arxiv.1902.09418,
title = {X-ray optics and beam characterization using random modulation: Theory},
author = {Sebastien Berujon and Ruxandra Cojocaru and Pierre Piault and Rafael Celestre and Thomas Roth and Raymond Barrett and Eric Ziegler},
journal= {arXiv preprint arXiv:1902.09418},
year = {2020}
}
Comments
10 pages, 3 figures, 1 table