Validating Continuum Lowering Models via Multi-Wavelength Measurements of Integrated X-ray Emission
Abstract
X-ray emission spectroscopy is a well-established technique used to study continuum lowering in dense plasmas. It relies on accurate atomic physics models to robustly reproduce high-resolution emission spectra, and depends on our ability to identify spectroscopic signatures such as emission lines or ionization edges of individual charge states within the plasma. Here we describe a method that forgoes these requirements, enabling the validation of different continuum lowering models based solely on the total intensity of plasma emission in systems driven by narrow-bandwidth x-ray pulses across a range of wavelengths. The method is tested on published Al spectroscopy data and applied to the new case of solid-density partially-ionized Fe plasmas, where extracting ionization edges directly is precluded by the significant overlap of emission from a wide range of charge states.
Keywords
Cite
@article{arxiv.1802.01234,
title = {Validating Continuum Lowering Models via Multi-Wavelength Measurements of Integrated X-ray Emission},
author = {M. F. Kasim and J. S. Wark and S. M. Vinko},
journal= {arXiv preprint arXiv:1802.01234},
year = {2020}
}