We present a one-port calibration technique for characterization of beam waveguide components with a vector network analyzer. This technique involves using a set of known delays to separate the responses of the instrument and the device under test. We demonstrate this technique by measuring the reflected performance of a millimeter-wave variable-delay polarization modulator.
@article{arxiv.1107.2453,
title = {Vector Reflectometry in a Beam Waveguide},
author = {Joseph R. Eimer and Charles L. Bennett and David T. Chuss and Edward J. Wollack},
journal= {arXiv preprint arXiv:1107.2453},
year = {2014}
}