Superconducting circuit testing and materials loss characterization requires robust and reliable methods for the extraction of internal and coupling quality factors of microwave resonators. A common method, imposed by limitations on the device design or experimental configuration, is the single-port reflection geometry, i.e. reflection-mode. However, impedance mismatches in cryogenic systems must be accounted for through calibration of the measurement chain while it is at low temperatures. In this paper, we demonstrate a data-based, single-port calibration using commercial microwave standards and a vector network analyzer (VNA) with samples at millikelvin temperature in a dilution refrigerator, making this method useful for measurements of quantum phenomena. Finally, we cross reference our data-based, single-port calibration and reflection measurement with over-coupled 2D- and 3D-resonators against well established two-port techniques corroborating the validity of our method.
@article{arxiv.2103.01491,
title = {Cryogenic single-port calibration for superconducting microwave resonator measurements},
author = {Haozhi Wang and S. Singh and C. R. H. McRae and J. C. Bardin and S. -X. Lin and N. Messaoudi and A. R. Castelli and Y. J. Rosen and E. T. Holland and D. P. Pappas and J. Y. Mutus},
journal= {arXiv preprint arXiv:2103.01491},
year = {2021}
}