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Thermal transient measurement based on source-drain voltage is a standard method to characterize thermal properties of silicon semiconductors but is doubtful to be directly applied to silicon carbide (SiC) devices. To evaluate its…

Applied Physics · Physics 2022-11-29 Yi Zhang , Yichi Zhang , Zhiliang Xu , Zhongxu Wang , Hon Wong , Zhebie Lu , Antonio Caruso

The extremely low threshold voltage (Vth) of native MOSFETs (Vth~0V@300K) is conducive to the design of cryogenic circuits. Previous research on cryogenic MOSFETs mainly focused on the standard threshold voltage (SVT) and low threshold…

Applied Physics · Physics 2021-09-01 Yuanke Zhang , Tengteng Lu , Wenjie Wang , Yujing Zhang , Jun Xu , Chao Luo , Guoping Guo

Many electrical applications of quantum dots rely on capacitively coupled gates; therefore, to make reliable devices we need those gate capacitances to be predictable and reproducible. We demonstrate in silicon nanowire quantum dots that…

Mesoscale and Nanoscale Physics · Physics 2015-06-05 Ted Thorbeck , Akira Fujiwara , Neil M. Zimmerman

We have presented an analytical physics-based compact model of GaN power FET, which can accurately describe the I-V characteristics in all operation modes. The model considers the source-drain resistance, different interface trap densities…

Applied Physics · Physics 2019-09-13 G. I. Zebrev , V. V. Orlov

The aim of this work is to design and implement an embedded system capable to characterize some relevant figures of merit of Gallium Nitride and Silicon Carbide transistors in a wide range of frequencies. In particular, the designed system…

Systems and Control · Electrical Eng. & Systems 2023-06-08 Alberto Vella , Giuseppe Galioto , Giuseppe Costantino Giaconia

A key requirement to perform simulations of large quantum systems on near-term quantum hardware is the design of quantum algorithms with short circuit depth that finish within the available coherence time. A way to stay within the limits of…

We have incorporated an aluminum single electron transistor directly into the defining gate structure of a semiconductor quantum dot, permitting precise measurement of the charge in the dot. Voltage biasing a gate draws charge from a…

Mesoscale and Nanoscale Physics · Physics 2009-10-31 D. Berman , N. B. Zhitenev , R. C. Ashoori , M. Shayegan

A method for assessing the quality of electronic material properties of thin-film metal oxide semiconductor field-effect transistors (MOSFETs) is presented. By investigating samples with MOCVD-grown MoS${_2}$ channels exposed to atmospheric…

Applied Physics · Physics 2025-04-03 Eros Reato , Ardeshir Esteki , Benny Ku , Zhenxing Wang , Michael Heuken , Max C. Lemme , Olof Engström

Recent experiments have demonstrated superconducting transmon qubits with semiconductor nanowire Josephson junctions. These hybrid gatemon qubits utilize field effect tunability characteristic for semiconductors to allow complete qubit…

Mesoscale and Nanoscale Physics · Physics 2016-04-20 L. Casparis , T. W. Larsen , M. S. Olsen , F. Kuemmeth , P. Krogstrup , J. Nygård , K. D. Petersson , C. M. Marcus

By solving the Bogoliubov - de Gennes equation self-consistently in the presence of a non-equilibrium quasi-particle distribution, we compute the current-voltage characteristic of a phase coherent superconducting island with a tunnel…

Condensed Matter · Physics 2009-10-28 A Martin , CJ Lambert

After more than 30 years of validation of Moore's law, the CMOS technology has already entered the nanoscale (sub-100nm) regime and faces strong limitations. The nanowire transistor is one candidate which has the potential to overcome the…

Mesoscale and Nanoscale Physics · Physics 2010-08-19 Vijay Sai Patnaik , Ankit Gheedia , M. Jagadesh Kumar

Extensive theoretical and experimental work has established high-fidelity electron shuttling in Si/SiGe systems, whereas demonstrations in Si/SiO2 (SiMOS) remain at an early stage. To help address this, we perform full 3D simulations of…

Quantum Physics · Physics 2026-04-21 Jack J. Turner , Christian W. Binder , Guido Burkard , Andrew J. Fisher

We propose a simple analytical model of a metal-oxide-semiconductor field-effect transistor with a lateral resonant gate based on the coupled electromechanical equations, which are self-consistently solved in time. All charge densities…

By developing a two-dimensional (2D) full quantum simulation, the attributes of carbon nanotube field-effect transistors (CNTFETs) in different temperatures have been comprehensively investigated. Simulations have been performed by…

Materials Science · Physics 2017-02-07 Ali Naderi , S. Mohammad Noorbakhsh , Hossein Elahipanah

Silicon carbide (SiC) metal-oxide-semiconductor field-effect-transistors (MOSFETs) enable high-voltage and high-temperature power conversion. Compared to Si devices, they suffer from pronounced gate leakage due to the reduced electron…

Materials Science · Physics 2025-12-03 Ang Feng , Alexander Karl , Dominic Waldhör , Marina Avramenko , Peter Moens , Tibor Grasser

A compact model for the effect of parasitic internal fringe capacitance on threshold voltage in high-K gate dielectric SOI MOSFETs is developed. Our model includes the effects of the gate dielectric permittivity, spacer oxide permittivity,…

Mesoscale and Nanoscale Physics · Physics 2015-05-19 M. Jagadesh Kumar , Sumeet Kumar Gupta , Vivek Venkataraman

Graphene nanostructures exhibit an intrinsic advantage in relation to the gate delay in three-terminal devices and provide additional benefits when operate in the quantum capacitance limit. In this paper, we developed a simple model that…

Mesoscale and Nanoscale Physics · Physics 2011-08-02 George S. Kliros

Developing fast, accurate and scalable techniques for quantum state readout is an active area in semiconductor-based quantum computing. Here, we present results on dispersive sensing of silicon corner state quantum dots coupled to…

In this paper, 20nm - 80nm channel length (Lch) InGaAs gate- all-around (GAA) nanowire MOSFETs with record high on- state and off-state performance have been demonstrated by equivalent oxide thickness (EOT) and nanowire width (WNW) scaling…

Mesoscale and Nanoscale Physics · Physics 2012-12-19 J. J. Gu , X. W. Wang , H. Wu , J. Shao , A. T. Neal , M. J. Manfra , R. G. Gordon , P. D. Ye

We present transport measurements of a tunable silicon metal-oxide-semiconductor double quantum dot device with lateral geometry. Experimentally extracted gate-to-dot capacitances show that the device is largely symmetric under the gate…