English

Gallium Nitride FET Model

Applied Physics 2019-09-13 v1 Materials Science

Abstract

We have presented an analytical physics-based compact model of GaN power FET, which can accurately describe the I-V characteristics in all operation modes. The model considers the source-drain resistance, different interface trap densities and self-heating effects.

Cite

@article{arxiv.1909.05702,
  title  = {Gallium Nitride FET Model},
  author = {G. I. Zebrev and V. V. Orlov},
  journal= {arXiv preprint arXiv:1909.05702},
  year   = {2019}
}

Comments

IOP Conference Series: Materials Science and Engineering, 5 pages, 2 figures

R2 v1 2026-06-23T11:13:33.605Z