Related papers: Micro-crystalline inclusions analysis by PIXE and …
This paper presents the standardization of Proton Induced X-rays Emission (PIXE) technique for the trace element analysis of thick standard samples. Three standard reference materials (SRMs) viz-\`a-vis titanium, copper and iron base alloys…
The toolbox for material characterization has never been richer than today. Great progress with all kinds of particles and interaction methods provide access to nearly all properties of an object under study. However, a tomographic analysis…
Gildings, patinas and alteration crusts are common features of many heritage artefacts, especially for metals. Their size depends on many factors, like the manufacturing method for gildings or the conservation state for alteration crusts:…
Proton Induced X-ray Emission (PIXE) using high energy protons is a non destructive multi elemental technique that can analyze medium and heavy trace elements on thick samples. A new experimental setup is being built at the ARRONAX facility…
Muon-Induced X-ray Emission (MIXE) is a non-destructive analytical technique that leverages negative muons to probe elemental and isotopic compositions by detecting characteristic muonic X-rays emitted during atomic cascades and gamma rays…
Among the existing elemental characterization techniques, Particle Induced X-ray Emission (PIXE) and Energy Dispersive X-ray (EDX) spectroscopy are two of the most widely used in different scientific and technological fields. Here we…
Microwave energy has been demonstrated to be beneficial for reducing the energetic cost of several steps of the mining process. Significant literature has been developed about this topic but few studies are focused on understanding the…
Understanding the applicability and limitations of electronic-structure methods needs careful and efficient comparison with accurate reference data. Knowledge of the quality and errors of electronic-structure calculations is crucial to…
Soil properties, such as wetting collapse behavior and permeability, are strongly correlated to the soil microstructure. To date, several techniques including mercury intrusion porosimetry (MIP), can be used to characterize the…
Isothermal Close Space Sublimation (ICSS) technique was used for embedding porous silicon (PS) films with ZnTe. It was studied the influence of the preparation conditions and in particular of a chemical etching step before the ZnTe growth,…
While electron microscopy offers crucial atomic-resolution insights into structure-property relationships, radiation damage severely limits its use on beam-sensitive materials like proteins and 2D materials. To overcome this challenge, we…
We study the effect of a finite sample size, beam divergence and detector thickness on the resolution function of a MIEZE spectrometer. We provide a transparent analytical framework which can be used to determine the optimal trade-off…
Microstructure characterization is of great value to understanding nuclear graphite's properties and irradiation behavior. However, graphite is soft and could be easily damaged during sample preparation. A three-step polishing method…
Continued improvement of the energy resolution of resonant inelastic x-ray scattering (RIXS) spectrometers is crucial for fulfilling the potential of this technique in the study of electron dynamics in materials of fundamental and…
Computed tomography (CT) can capture volumes large enough to measure a statistically meaningful number of micron-sized particles with a sufficiently good resolution to allow for the analysis of individual particles. However, the development…
Non-destructive nano-imaging of the internal structure of solid matter is only feasible using hard X-rays due to their high penetration. The highest resolution images are achieved at synchrotron radiation sources (SRF), offering superior…
Based on kinematic model of parametric X-ray Radiation (PXR), an approach for calculation of PXR characteristics (spectrum, intensity, polarization and yield) has been developed. The approach allows to take into account the beam divergence,…
Piezoresponse Force Microscopy (PFM) is one of the most widespread methods for investigating and visualizing ferroelectric domain structures down to the nanometer length scale. PFM makes use of the direct coupling of the piezoelectric…
The evolution of particle detectors dates back to the discovery of X-rays and radioactivity in 1890s. In detector history, the Resistive Plate Chambers (RPCs) are introduced in early 1980s. An RPC is a gaseous detector made up of two…
Techniques have been developed to measure the isotopic composition of trace elements from matrices predominantly consisting of interfering isotopes. These techniques have been applied to measuring mass-independent fractionation of…