This paper presents the standardization of Proton Induced X-rays Emission (PIXE) technique for the trace element analysis of thick standard samples. Three standard reference materials (SRMs) viz-\`a-vis titanium, copper and iron base alloys were used for the study due to their availability. The protons beam was accelerated up to 2.57 MeV energy by 5UDH-II tandem Pelletron accelerator and samples were irradiated at different geometry and durations. Spectrum was acquired using a multi-channel spectrum analyzer while spectrum analysis was done using a GUPIXWIN model for determination of elemental concentrations of trace elements. The obtained experimental data was compared with theoretical data and results were found in close agreement.
@article{arxiv.1703.04532,
title = {Standardization of Proton Induced X-Ray Emission for Analysis of Trace Elements in Thick Targets},
author = {Johar Zeb and Shad Ali and Muhammad Haneef and Azhar Muhammad Naeem and Jehan Akbar},
journal= {arXiv preprint arXiv:1703.04532},
year = {2020}
}