X-ray diffraction with micrometer spatial resolution for highly absorbing samples
Abstract
X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materials by X-ray fluorescence have been limited due to the utilisation of low photon energies. Here, we report on a goniometer-based setup implemented at the P06 beamline of PETRA III that allows for micrometer spatial resolution with a photon energy of 35 keV and above. A highly focused beam was achieved by using compound refractive lenses and high precision sample manipulation was enabled by a goniometer that allows for up to 5D scans (3 rotations & 2 translations). As experimental examples, we demonstrate the determination of local strain variations in martensitic steel samples with micrometer spatial resolution as well as the simultaneous elemental distribution for high-Z materials in a thin film solar cell. Our proposed approach allows users from the materials science community to determine micro-structural properties even in highly absorbing samples.
Cite
@article{arxiv.2201.13264,
title = {X-ray diffraction with micrometer spatial resolution for highly absorbing samples},
author = {P. Chakrabarti and A. Wildeis and M. Hartmann and R. Brandt and R. Döhrmann and G. Fevola and C. Ossig and M. E. Stuckelberger and J. Garrevoet and K. V. Falch and V. Galbierz and G. Falkenberg and P. Modregger},
journal= {arXiv preprint arXiv:2201.13264},
year = {2022}
}