Related papers: Micro-crystalline inclusions analysis by PIXE and …
The traditional display of elements in the periodic table is convenient for the study of chemistry and physics. However, the atomic number alone is insufficient for training statistical machine learning models to describe and extract…
Scanning probe microscopy is one of the most versatile windows into the nanoworld, providing imaging access to a variety of sample properties, depending on the probe employed. Tunneling probes map electronic properties of samples, magnetic…
Silicon immersion gratings and grisms enable compact, near-infrared spectrographs with high throughput. These instruments find use in ground-based efforts to characterize stellar and exoplanet atmospheres, and in space-based observatories.…
The usage of muonic X-rays to study elemental properties like nuclear radii ranges back to the seventies. This triggered the pioneering work at the Paul Scherrer Institute (PSI), during the eighties, on the Muon Induced X-ray Emission…
Thin film systems are often analysed by using sputter depth profiling. First the sample gets eroded by inert gas ion impact during sputter depth profiling. Then the elemental composition of the freshly unveiled surface is determined by…
Fine holes are an important structural component of industrial components, and their inner surface quality is closely related to their function.In order to detect the quality of the inner surface of the fine hole,a special optical…
Grazing incidence X-ray diffraction (GIXD) is widely used for the structural characterization of thin films, particularly for analyzing phase composition and the orientation distribution of crystallites. While various tools exist for…
To characterise (inter)diffusion in materials, concentration profiles can be measured by EDX. It allows one to determine the chemical composition with a very good accuracy if measurement artefacts are accounted for. Standard phenomena (such…
Dark Field X-ray Microscopy (DFXM) has advanced 3D non-destructive, high-resolution imaging of strain and orientation in crystalline materials, enabling the study of embedded structures in bulk. However, the photon-intensive nature of…
Resonant Inelastic X-Ray Scattering (RIXS) is a well-established tool for probing excitations in a wide range of materials. The measured spectra strongly depend on the scattering geometry, via its influence on the polarization of the…
On-chip Electron Spin Resonance (ESR) of magnetic molecules requires the ability to precisely position nanosized samples in antinodes of the electro-magnetic field for maximal magnetic interaction. A method is developed to entrap…
The goal of the international Muon Ionization Cooling Experiment (MICE) is to demonstrate muon beam ionization cooling for the first time. It constitutes a key part of the R&D towards a future neutrino factory or muon collider. The intended…
Muon Induced X-ray Emission (MIXE) was discovered by Chinese physicist Zhang Wenyu as early as 1947, and it can conduct non-destructive elemental analysis inside samples. Research has shown that MIXE can retain the high efficiency of direct…
Energy dispersive X-ray fluorescence (EDXRF) is a widely used non-destructive technique for micro and trace multi-element analysis of materials. Conventional trials show that using laboratory assisted EDXRF measurements, one can obtain…
Surface analyses inside the nanopore, micropore, and a very narrow pipe are important topics for development of the chemical engineering. Here, we propose a measuring method which evaluates the surface coverage of the chemically modified…
In this paper synchrotron microtomography on Plasma Sprayed Tungsten (PS-W) is presented and discussed. PS-W is a challenging material for microtomography since it exhibits a random porous network at different length-scales (from nanometers…
Optical investigations on the dynamics of dense suspensions are challenging due to reduced optical accessibility. Furthermore, the suspension particle image size can strongly deviate from the optimal particle image size for PIV…
One of the possible ways to maintain the micrometer spatial resolution while performing ion beam analysis in the air is to increase the energy of ions. In order to explore capabilities and limitations of this approach, we have tested a…
Aims. This article aims to provide an alternative method of measuring the porosity of multi-phase composite ices from their refractive indices and of characterising how the abundance of a premixed contaminant (e.g., CO2) affects the…
Microstructural analysis with electron backscatter diffraction (EBSD) involves sectioning and polishing to create a flat and preparation-artifact free surface. The quality of EBSD analysis is often dependant on this step, and this motivates…