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An alternative approach to the image simulation in high resolution transmission electron microscopy (HRTEM) is introduced after comparative analysis of the existing image simulation methods. The alternative method is based on considering…

Materials Science · Physics 2021-03-30 Usha Bhat , Ranjan Datta

We experimentally demonstrate a non-imaging approach to displacement measurement for complex scattering materials. By spatially controlling the wave front of the light that incidents on the material we concentrate the scattered light in a…

Optics · Physics 2015-06-03 E. G. van Putten , A. Lagendijk , A. P. Mosk

Growth of large-scale graphene is still accompanied by imperfections. By means of a four-tip STM/SEM the local structure of graphene grown on SiC(0001) was correlated with scanning electron microscope images and spatially resolved transport…

Mesoscale and Nanoscale Physics · Physics 2015-06-17 Jens Baringhaus , Frederik Edler , Christoph Neumann , Christoph Stampfer , Stiven Forti , Ulrich Starke , Christoph Tegenkamp

Electronic conduction pathways in dielectric thin films are explored using automated experiments in scanning probe microscopy (SPM). Here, we use large field of view scanning to identify the position of localized conductive spots and…

An ultra-strong photovoltaic effect has recently been reported for electrons trapped on a liquid Helium surface under a microwave excitation tuned at intersubband resonance [D. Konstantinov et. al. : J. Phys. Soc. Jpn. 81, 093601 (2012) ].…

Mesoscale and Nanoscale Physics · Physics 2013-07-24 F. Closa , E. Raphael , A. D. Chepelianskii

Stepped well-ordered semiconductor surfaces are important as nanotemplates for the fabrication of one-dimensional nanostructures which are candidates of intriguing electronic properties. Therefore a detailed understanding of the underlying…

Mesoscale and Nanoscale Physics · Physics 2017-11-08 Carmen P érez León , Holger Drees , Stefan Martin Wippermann , Michael Marz , Regina Hoffmann-Vogel

Electromechanical coupling is ubiquitous in nature and underpins the functionality of materials and systems as diverse as ferroelectric and multiferroic materials, electrochemical devices, and biological systems, and strain-based scanning…

Materials Science · Physics 2014-04-10 Qian Nataly Chen , Yun Ou , Feiyue Ma , Jiangyu Li

Atmospheric pressure plasma jets (APPJs) are versatile devices with numerous applications. This work focuses on APPJs generated at the tip of long, flexible tubes using the jet transfer technique. The plasma source consists of a primary…

The design of modular, passive, and static artificial metasurfaces to be used as electromagnetic skins (EMSs) of buildings for improving the coverage in urban millimeter-wave communication scenarios is addressed. Towards this end, an ad-hoc…

Systems and Control · Electrical Eng. & Systems 2022-11-23 Paolo Rocca , Pietro Da Rù , Nicola Anselmi , Marco Salucci , Giacomo Oliveri , Danilo Erricolo , Andrea Massa

We have developed a new technique for photothermal displacement spectroscopy that is potentially orders of magnitude more sensitive than conventional methods. We use a single Fabry-Perot resonator to enhance both the intensity of the pump…

Materials Science · Physics 2009-11-10 Eric D. Black , Ivan S. Grudinin , Shanti R. Rao , Kenneth G. Libbrecht

A numerical modeling study based on 3D finite element method (FEM) simulation and 1D analytical solutions has been carried out to evaluate the capabilities of two ac methods for measuring in-plane thermal conductivity of thin film deposited…

Applied Physics · Physics 2020-12-22 Hanfu Wang , Yanjun Guo , Kaiwu Peng , Weiguo Chu , Guangming Chen

Inertial measurement units (IMUs) increasingly function as a basic component of wearable sensor network (WSN)systems. IMU-based joint angle estimation (JAE) is a relatively typical usage of IMUs, with extensive applications. However, the…

Signal Processing · Electrical Eng. & Systems 2021-06-10 Chunzhi Yi , Feng Jiang , Baichun Wei , Chifu Yang , Zhen Ding , Jubo Jin , Jie Liu

The electrical response of a material when illuminated with light is a key to many optoelectronic device applications. This so-called photoresponse typically has a non-uniform spatial distribution through the active device area, and the…

Materials Science · Physics 2026-05-11 Talip Serkan Kasırga

Secondary electron (SE) imaging offers a powerful complementary capabilities to conventional scanning transmission electron microscopy (STEM) by providing surface-sensitive, pseudo-3D topographic information. However, contrast…

Applied Physics · Physics 2025-11-19 Evgenii Vlasov , Wouter Heyvaert , Tom Stoops , Sandra Van Aert , Johan Verbeeck , Sara Bals

Understanding the opto-electronic properties of semiconducting polymers under external strain is essential for their applications in flexible opto-electronic, light-emitting and photovoltaic devices. While prior studies have highlighted the…

Applied Physics · Physics 2021-11-24 Taeyong Kim , Saejin Oh , Usama Choudhry , Carl Meinhart , Michael L. Chabinyc , Bolin Liao

Skyrmions in ultrathin ferromagnetic metal (FM)/heavy metal (HM) multilayer systems produced by conventional sputtering methods have recently generated huge interest due to their applications in the field of spintronics. The sandwich…

We compare two transmission electron microscopy (TEM) based techniques that can provide highly spatially resolved quantitative measurements of magnetic induction fields at high sensitivity. To this end, the magnetic induction of a…

We demonstrate a multi-beam scanning transmission electron microscopy (STEM) imaging that integrates down-sampling with super-resolution image reconstruction via a compressive sensing framework. A custom condenser aperture with six randomly…

Instrumentation and Detectors · Physics 2026-03-19 Akira Yasuhara , Takumi Sannomiya , Ryoichi Horisaki

In this work, we develop several inference methods to estimate the position of dislocations from images generated using dark-field X-ray microscopy (DFXM) -- achieving superresolution accuracy and principled uncertainty quantification.…

Materials Science · Physics 2022-09-01 Michael C. Brennan , Marylesa Howard , Youssef Marzouk , Leora E. Dresselhaus-Marais