Non-Imaging Speckle Interferometry forHigh Speed Nanometer-Scale Position Detection
Abstract
We experimentally demonstrate a non-imaging approach to displacement measurement for complex scattering materials. By spatially controlling the wave front of the light that incidents on the material we concentrate the scattered light in a focus on a designated position. This wave front acts as an unique optical fingerprint that enables precise position detection of the illuminated material by simply measuring the intensity in the focus. By combining two optical fingerprints we demonstrate position detection along one dimension with a displacement resolution of 2.1 nm. As our approach does not require an image of the scattered field, it is possible to employ fast non-imaging detectors to enable high-speed position detection of scattering materials.
Cite
@article{arxiv.1111.4120,
title = {Non-Imaging Speckle Interferometry forHigh Speed Nanometer-Scale Position Detection},
author = {E. G. van Putten and A. Lagendijk and A. P. Mosk},
journal= {arXiv preprint arXiv:1111.4120},
year = {2015}
}
Comments
4 pages, 3 figures