Enhanced photothermal displacement spectroscopy for thin-film characterization using a Fabry-Perot resonator
Abstract
We have developed a new technique for photothermal displacement spectroscopy that is potentially orders of magnitude more sensitive than conventional methods. We use a single Fabry-Perot resonator to enhance both the intensity of the pump beam and the sensitivity of the probe beam. The result is an enhancement of the response of the instrument by a factor proportional to the square of the finesse of the cavity over conventional interferometric measurements. In this paper we present a description of the technique, and we discuss how the properties of thin films can be deduced from the photothermal response. As an example of the technique, we report a measurement of the thermal properties of a multilayer dielectric mirror similar to those used in interferometric gravitational wave detectors.
Keywords
Cite
@article{arxiv.cond-mat/0310194,
title = {Enhanced photothermal displacement spectroscopy for thin-film characterization using a Fabry-Perot resonator},
author = {Eric D. Black and Ivan S. Grudinin and Shanti R. Rao and Kenneth G. Libbrecht},
journal= {arXiv preprint arXiv:cond-mat/0310194},
year = {2009}
}
Comments
Style changes and spelling corrections; removed redundant figure