We present a non-resonant inelastic x-ray scattering study at the carbon K-edge on aligned poly[9,9-bis(2-ethylhexyl)-fluorene-2,7-diyl] and show that the x-ray Raman scattering technique can be used as a practical alternative to x-ray absorption measurements. We demonstrate that this novel method can be applied to studies on aligned π-conjugated polymers complementing diffraction and optical studies. Combining the experimental data and a very recently proposed theoretical scheme we demonstrate a unique property of x-ray Raman scattering by performing the symmetry decomposition on the density of unoccupied electronic states into s- and p-type symmetry contributions.
@article{arxiv.cond-mat/0608623,
title = {X-ray Raman scattering study of aligned polyfluorene},
author = {S. Galambosi and M. Knaapila and J. A. Soininen and K. Nygård and S. Huotari and F. Galbrecht and U. Scherf and A. P. Monkman and K. Hämäläinen},
journal= {arXiv preprint arXiv:cond-mat/0608623},
year = {2016}
}