We describe near-field imaging of sample sheet resistance via frequency shifts in a resonant coaxial scanning microwave microscope. The frequency shifts are related to local sample properties, such as surface resistance and dielectric constant. We use a feedback circuit to track a given resonant frequency, allowing measurements with a sensitivity to frequency shifts as small as one parts in 50000 for a 30 ms sampling time. The frequency shifts can be converted to sheet resistance based on a simple model of the system.
@article{arxiv.cond-mat/9712142,
title = {Surface Resistance Imaging with a Scanning Near-Field Microwave Microscope},
author = {D. E. Steinhauer and C. P. Vlahacos and S. K. Dutta and F. C. Wellstood and Steven M. Anlage},
journal= {arXiv preprint arXiv:cond-mat/9712142},
year = {2009}
}
Comments
6 pages, 3 figures; for color versions of figures see www.csr.umd.edu/research/hifreq/micr_microscopy.html