We have developed scanning near-field microwave microscopes which can image electrodynamic properties of superconducting materials on length scales down to about 2 μm. The microscopes are capable of quantitative imaging of sheet resistance of thin films, and surface topography. We demonstrate the utility of the microscopes through images of the sheet resistance of a YBa2Cu3O7-d thin film wafer, images of bulk Nb surfaces, and spatially resolved measurements of Tc of a YBa2Cu3O7-d thin film. We also discuss some of the limitations of the microscope and conclude with a summary of its present capabilities.
@article{arxiv.cond-mat/9811158,
title = {Superconducting Material Diagnostics using a Scanning Near-Field Microwave Microscope},
author = {Steven M. Anlage and D. E. Steinhauer and C. P. Vlahacos and B. J. Feenstra and A. S. Thanawalla and Wensheng Hu and Sudeep K. Dutta and F. C. Wellstood},
journal= {arXiv preprint arXiv:cond-mat/9811158},
year = {2016}
}
Comments
6 pages with 9 figures, Proceedings of the Applied Superconductivity Conference 1998