High-temperature superconducting microbridges implemented with YBa(2)Cu(3)O(7-delta) thin-films are shown to be possible fault current limiters for microelectronic devices with some elements working at temperatures below the superconducting critical temperature and, simultaneously, under very low power conditions (below 1W). This is the case in the important applications of superconductors as SQUID based electronics, and technologies for communication or infrared detectors. In this paper it is shown that the good thermal behavior of these microlimiters allows working in a regime where even relatively small faults induce their transition to highly dissipative states, dramatically increasing their limitation efficiency. The conditions for optimal refrigeration and operation of these microlimiters are also proposed.
@article{arxiv.0901.2299,
title = {High-temperature superconducting fault current microlimiters},
author = {J. A. Lorenzo Fernandez and M. R. Osorio and J. A. Veira and F. Vidal},
journal= {arXiv preprint arXiv:0901.2299},
year = {2009}
}