In this paper we present a simple and efficient built-in temperature sensor for thermal monitoring of standard-cell based VLSI circuits. The proposed smart temperature sensor uses a ring-oscillator composed of complex gates instead of inverters to optimize their linearity. Simulation results from a 0.18μm CMOS technology show that the non-linearity error of the sensor can be reduced when an adequate set of standard logic gates is selected.
@article{arxiv.0710.4733,
title = {Smart Temperature Sensor for Thermal Testing of Cell-Based ICs},
author = {S. A. Bota and M. Rosales and J. L. Rossello and J. Segura},
journal= {arXiv preprint arXiv:0710.4733},
year = {2011}
}
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