Integrated Circuit Readout for the Silicon Sensor Test Station

E. Atkin; A. Kluev; A. Silaev; A. Fedenko; D. Karmanov; M. Merkin; A. Voronin

Integrated Circuit Readout for the Silicon Sensor Test Station

Instrumentation and Detectors 2009-10-13 v1

Authors: E. Atkin , A. Kluev , A. Silaev , A. Fedenko , D. Karmanov , M. Merkin , A. Voronin

Abstract

Various chips for the silicon sensors measurements are described. These chips are based on 0.35 um and 0.18um CMOS technology. Several analog chips together with self-trigger /derandomizer one allow to measure silicon sensors designed for different purposes. Tracking systems, calorimeters, particle charge measurement system and other application sensors can be investigated by the integrated circuit readout with laser or radioactive sources. Also electrical parameters of silicon sensors can be studied by such test setup.

Keywords

detector readout electronics particle detector cryogenics

Cite

@article{arxiv.0906.2063,
  title  = {Integrated Circuit Readout for the Silicon Sensor Test Station},
  author = {E. Atkin and A. Kluev and A. Silaev and A. Fedenko and D. Karmanov and M. Merkin and A. Voronin},
  journal= {arXiv preprint arXiv:0906.2063},
  year   = {2009}
}

Comments

6 pages, 5 figures

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