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A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs

Hardware Architecture 2011-11-09 v1

Abstract

As technology scales down, the static power is expected to become a significant fraction of the total power. The exponential dependence of static power with the operating temperature makes the thermal profile estimation of high-performance ICs a key issue to compute the total power dissipated in next-generations. In this paper we present accurate and compact analytical models to estimate the static power dissipation and the temperature of operation of CMOS gates. The models are the fundamentals of a performance estimation tool in which numerical procedures are avoided for any computation to set a faster estimation and optimization. The models developed are compared to measurements and SPICE simulations for a 0.12mm technology showing excellent results.

Keywords

Cite

@article{arxiv.0710.4759,
  title  = {A Fast Concurrent Power-Thermal Model for Sub-100nm Digital ICs},
  author = {J. L. Rossello and V. Canals and S. A. Bota and A. Keshavarzi and J. Segura},
  journal= {arXiv preprint arXiv:0710.4759},
  year   = {2011}
}

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Submitted on behalf of EDAA (http://www.edaa.com/)

R2 v1 2026-06-21T09:36:10.361Z