In this paper we explore the effect of δ-ray emission, fluctuations in th e signal deposition on the detection of charged particles in silicon-based detec tors. We show that these two effects ultimately limit the resolution that can be achieved by interpolation of the signal in finely segmented position-sensitive solid-state devices.
@article{arxiv.1404.4535,
title = {Physical limitations to the spatial resolution of solid-state detectors},
author = {M. Boronat and C. Marinas and A. Frey and I. Garcia and B. Schwenker and M. Vos and F. Wilk},
journal= {arXiv preprint arXiv:1404.4535},
year = {2015}
}