The optical properties of lead zirconate titanate (PZT) thin films deposited on ZnO were studied by m-lines spectroscopy. In order to retrieve the refractive index and the thickness of both layers from the m-lines spectra, we develop a numerical algorithm for the case of a two-layer system and show its robustness in the presence of noise. The sensitivity of the algorithm of the two-layer model allows us to relate the observed changes in the PZT refractive index to the PZT structural change due to the ZnO interface of the PZT/ZnO optical waveguide.
@article{arxiv.1510.07014,
title = {Optical properties of PZT thin films deposited on a ZnO buffer layer},
author = {T Schneider and D Leduc and J. Cardin and C Lupi and N Barreau and H Gundel},
journal= {arXiv preprint arXiv:1510.07014},
year = {2015}
}