A method to retrieve optical and geometrical characteristics of three layer waveguides from m-lines measurements
Materials Science
2014-05-27 v1 Optics
Abstract
We consider three layer optical waveguides and present a method to measure simultaneously the refractive index and the thickness of each layer with m-lines spectroscopy. We establish the three layer waveguide modal dispersion equations and describe a numerical method to solve these equations. The accuracy of the method is evaluated by numerical simulations with noisy data and experimentally demonstrated using a PZT thin film placed between two ZnO layers.
Keywords
Cite
@article{arxiv.1405.6501,
title = {A method to retrieve optical and geometrical characteristics of three layer waveguides from m-lines measurements},
author = {Thomas Schneider and Dominique Leduc and Cyril Lupi and Julien Cardin and Hartmut Gundel and Christian Boisrobert},
journal= {arXiv preprint arXiv:1405.6501},
year = {2014}
}