Measuring the Nonlinear Refractive Index of Graphene using the Optical Kerr Effect Method
Optics
2016-08-02 v1
Abstract
By means of the ultrafast optical Kerr effect method coupled to optical heterodyne detection (OHD-OKE), we characterize the third order nonlinear response of graphene at telecom wavelength, and compare it to experimental values obtained by the Z-scan method on the same samples. From these measurements, we estimate a negative nonlinear refractive index for monolayer graphene, . This is in contradiction to previously reported values, which leads us to compare our experimental measurements obtained by the OHD-OKE and the Z-scan method with theoretical and experimental values found in the literature, and to discuss the discrepancies, taking into account parameters such as doping.
Keywords
Cite
@article{arxiv.1607.00911,
title = {Measuring the Nonlinear Refractive Index of Graphene using the Optical Kerr Effect Method},
author = {Evdokia Dremetsika and Bruno Dlubak and Simon-Pierre Gorza and Charles Ciret and Marie-Blandine Martin and Stephan Hofmann and Pierre Seneor and Daniel Dolfi and Serge Massar and Philippe Emplit and Pascal Kockaert},
journal= {arXiv preprint arXiv:1607.00911},
year = {2016}
}
Comments
To be published in Optics Letters