Determining the refractive index, absolute thickness and local slope of a thin transparent film using multi-wavelength and multi-incident-angle interference
Optics
2020-08-26 v1 Other Condensed Matter
Abstract
We describe a high-speed interferometric method, using multiple angles of incidence and multiple wavelengths, to measure the absolute thickness, tilt, the local angle between the surfaces, and the refractive index of a fluctuating transparent wedge. The method is well suited for biological, fluid and industrial applications.
Keywords
Cite
@article{arxiv.2005.10437,
title = {Determining the refractive index, absolute thickness and local slope of a thin transparent film using multi-wavelength and multi-incident-angle interference},
author = {Mengfei He and Sidney R. Nagel},
journal= {arXiv preprint arXiv:2005.10437},
year = {2020}
}
Comments
9 pages, 10 figures