In-depth analysis of CIGS film for solar cells, structural and optical characterization

A. Slobodskyy; T. Slobodskyy; T. Ulyanenkova; S. Doyle; M. Powalla; T. Baumbach; U. Lemmer

doi:10.1063/1.3529939

In-depth analysis of CIGS film for solar cells, structural and optical characterization

Optics 2011-01-04 v2 Materials Science

Authors: A. Slobodskyy , T. Slobodskyy , T. Ulyanenkova , S. Doyle , M. Powalla , T. Baumbach , U. Lemmer

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Abstract

Space-resolved X-ray diffraction measurements performed on gradient-etched CuInGaSe2 (CIGS) solar cells provide information about stress and texture depth profiles in the absorber layer. An important parameter for CIGS layer growth dynamics, the absorber thickness-dependent stress in the molybdenum back contact is analyzed. Texturing of grains and quality of the polycrystalline absorber layer are correlated with the intentional composition gradients (band gap grading). Band gap gradient is determined by space-resolved photoluminescence measurements and correlated with composition and strain profiles.

Keywords

CIGS solar cells space-resolved X-ray diffraction stress depth profile texture band gap grading photoluminescence

Cite

@article{arxiv.1010.2909,
  title  = {In-depth analysis of CIGS film for solar cells, structural and optical characterization},
  author = {A. Slobodskyy and T. Slobodskyy and T. Ulyanenkova and S. Doyle and M. Powalla and T. Baumbach and U. Lemmer},
  journal= {arXiv preprint arXiv:1010.2909},
  year   = {2011}
}

In-depth analysis of CIGS film for solar cells, structural and optical characterization

Abstract

Keywords

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