Identification of vacancy defects in a thin film perovskite oxide

D. J. Keeble; R. A. Mackie; W. Egger; B. Lowe; P. Pikart; C. Hugenschmidt; T. J. Jackson

doi:10.1103/PhysRevB.81.064102

Identification of vacancy defects in a thin film perovskite oxide

Materials Science 2015-05-13 v1

Authors: D. J. Keeble , R. A. Mackie , W. Egger , B. Lowe , P. Pikart , C. Hugenschmidt , T. J. Jackson

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Abstract

Vacancy defects in thin film laser ablated SrTiO3 on SrTiO3 were identified using variable energy positron annihilation lifetime measurements. Strontium vacancy related defects were the dominant positron traps and, apart from in the top ~ 50 nm, were found to be uniformly distributed. The surface layer showed an increase in annihilation from larger open-volume defects, large vacancy clusters or nanovoids.

Keywords

vacancy defects thin film perovskite oxide SrTiO3 positron annihilation lifetime laser ablation

Cite

@article{arxiv.0906.5558,
  title  = {Identification of vacancy defects in a thin film perovskite oxide},
  author = {D. J. Keeble and R. A. Mackie and W. Egger and B. Lowe and P. Pikart and C. Hugenschmidt and T. J. Jackson},
  journal= {arXiv preprint arXiv:0906.5558},
  year   = {2015}
}

Comments

16 pages, 2 figures, 1 Table

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