Ultra-Sensitive Extinction Measurements of Optically Active Defects in Monolayer MoS$_2$
Mesoscale and Nanoscale Physics
2022-12-21 v1 Materials Science
Abstract
We utilize cavity-enhanced extinction spectroscopy to directly quantify the optical absorption of defects in MoS generated by helium ion bombardment. We achieve hyperspectral imaging of specific defect patterns with a detection limit below 0.01% extinction, corresponding to a detectable defect density below cm. The corresponding spectra reveal a broad sub-gap absorption, being consistent with theoretical predictions related to sulfur vacancy-bound excitons in MoS. Our results highlight cavity-enhanced extinction spectroscopy as efficient means for the detection of optical transitions in nanoscale thin films with weak absorption, applicable to a broad range of materials.
Keywords
Cite
@article{arxiv.2212.10231,
title = {Ultra-Sensitive Extinction Measurements of Optically Active Defects in Monolayer MoS$_2$},
author = {Florian Sigger and Ines Amersdorffer and Alexander Hötger and Manuel Nutz and Jonas Kiemle and Takashi Taniguchi and Kenji Watanabe and Michael Förg and Jonathan Noe and Jonathan J. Finley and Alexander Högele and Alexander W. Holleitner and Thomas Hümmer and David Hunger and Christoph Kastl},
journal= {arXiv preprint arXiv:2212.10231},
year = {2022}
}
Comments
17 pages main manuscript, 7 pages supporting information