Helium diffraction on SiC grown graphene, qualitative and quantitative description with the hard corrugated wall model

Maxime Debiossac; Asier Zugarramurdi; Zhao Mu; Petru Lunca-Popa; Andrew Mayne; Philippe Roncin

doi:10.1103/PhysRevB.94.205403

Helium diffraction on SiC grown graphene, qualitative and quantitative description with the hard corrugated wall model

Materials Science 2016-11-23 v2

Authors: Maxime Debiossac , Asier Zugarramurdi , Zhao Mu , Petru Lunca-Popa , Andrew Mayne , Philippe Roncin

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Abstract

The Moir\'{e} structure of epitaxial graphene mono layer grown on 6H-SiC(0001) has been investigated recently by grazing incidence fast atom diffraction, and the results were compared with the calculation of the structure \textit{ab initio} and exact diffraction codes. We review these results and present a complementary approach using the Hard Wall Model to extract information without any \textit{a priori}. Reversely, taking advantage of previous exact calculations we evaluate quantitatively the performance of this simplified approach by comparing predictions using the same potential energy surface.

Keywords

helium diffraction graphene on SiC moiré structure hard wall model grazing incidence fast atom diffraction ab initio calculation

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@article{arxiv.1605.04937,
  title  = {Helium diffraction on SiC grown graphene, qualitative and quantitative description with the hard corrugated wall model},
  author = {Maxime Debiossac and Asier Zugarramurdi and Zhao Mu and Petru Lunca-Popa and Andrew Mayne and Philippe Roncin},
  journal= {arXiv preprint arXiv:1605.04937},
  year   = {2016}
}

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8 pages, 12 figures

Helium diffraction on SiC grown graphene, qualitative and quantitative description with the hard corrugated wall model

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Keywords

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