We have developed a novel fabrication process for ultra-small, full-epitaxial NbN Josephson junctions on a silicon (Si) substrate. A full-epitaxial NbN/AlN/NbN tri-layer was grown on a Si (100) wafer with a (200)-oriented TiN buffer layer. It was patterned into Josephson junctions by an electron beam lithography (EBL) for junction definition followed by a reactive ion etch (RIE). A chemical mechanical polishing (CMP) process and an additional RIE by using CHF3 gas formed reliable electrical contacts between the junction counter electrodes and the wiring layer. All fabricated junctions, with a junction size down to 0.27 μm in diameter, showed excellent current-voltage characteristics with a clear gap structure and a small sub-gap leakage current. The dielectric layer of SiO2 that served as an insulator between base and counter electrodes was removed in a wet etching process using a buffered HF solution. We have confirmed that the quality of the junctions was maintained after the removal of the SiO2 dielectric layer.
@article{arxiv.2004.00922,
title = {Fabrication of Deep-Sub-Micrometer NbN/AlN/NbN Epitaxial Junctions on a Si Substrate},
author = {Wei Qiu and Hirotaka Terai},
journal= {arXiv preprint arXiv:2004.00922},
year = {2020}
}