We determine the effective g-factor (∣g∗∣) of a two-dimensional electron gas (2DEG) using a new method based on capacitance spectroscopy. The capacitance-voltage profile of a 2DEG in an InAs/AlGaSb quantum well measured in an in-plane magnetic field shows a double-step feature that indicates the Zeeman splitting of the subband edge. The method allows for simultaneous and independent determination of ∣g∗∣ and effective mass m∗. Data suggest that the biaxial tensile strain in the InAs layer has considerable impacts on both m∗ and g∗. Our method provides a means to determine ∣g∗∣ that is complementary to the commonly used coincidence technique.
Cite
@article{arxiv.2005.09355,
title = {Determination of $g$-factor in InAs two-dimensional electron system by capacitance spectroscopy},
author = {Hiroshi Irie and Takafumi Akiho and Koji Muraki},
journal= {arXiv preprint arXiv:2005.09355},
year = {2020}
}