Atomically thin polycrystalline transition-metal dichalcogenides (TMDs) are relevant to both fundamental science investigation and applications. TMD thin-films present uniquely difficult challenges to effective nanoscale crystalline characterization. Here we present a method to quickly characterize the nanocrystalline grain structure and texture of monolayer WS2 films using scanning nanobeam electron diffraction coupled with multivariate statistical analysis of the resulting data. Our analysis pipeline is highly generalizable and is a useful alternative to the time consuming, complex, and system-dependent methodology traditionally used to analyze spatially resolved electron diffraction measurements.
@article{arxiv.2001.11153,
title = {Characterizing Transition-Metal Dichalcogenide Thin-Films using Hyperspectral Imaging and Machine Learning},
author = {Brian Shevitski and Christopher T. Chen and Christoph Kastl and Tevye Kuykendall and Adam Schwartzberg and Shaul Aloni and Alex Zettl},
journal= {arXiv preprint arXiv:2001.11153},
year = {2020}
}