The results of the BTeV silicon pixel detector beam test carried out at Fermilab in 1999-2000 are reported. The pixel detector spatial resolution has been studied as a function of track inclination, sensor bias, and readout threshold.
@article{arxiv.hep-ex/0009023,
title = {Beam Test Results of the BTeV Silicon Pixel Detector},
author = {G. Chiodini and J. A. Appel and M. Artuso and J. N. Butler and G. Cardoso and H. Cheung and D. C. Christian and A. Colautti and R. Coluccia and M. Di Corato and E. E. Gottschalk and B. K. Hall and J. Hoff and P. A. Kasper and R. Kutschke and S. W. Kwan and A. Mekkaoui and D. Menasce and C. Newsom and S. Sala and R. Yarema and J. C. Wang and S. Zimmermann},
journal= {arXiv preprint arXiv:hep-ex/0009023},
year = {2008}
}
Comments
8 pages of text, 8 figures, Proceedings paper of Pixel 2000: International Workshop on Semiconductor Pixel Detectors for Particles and X-Rays, Genova, June 5-8, 2000