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We report on progress in developing compact sensors for atomic force microscopy (AFM), in which the mechanical transducer is integrated with near-field optical readout on a single chip. The motion of a nanoscale, doubly-clamped cantilever…

光学 · 物理学 2015-06-05 Yuxiang Liu , Houxun Miao , Vladimir Aksyuk , Kartik Srinivasan

An all-electrical torque differential magnetometry (also known as cantilever magnetometry) setup employing piezoelectric quartz tuning forks is demonstrated. The magnetometer can be operated under ambient conditions as well as low…

The current progress of materials science regarding multifunctional materials (MFM) has put forward the challenges to understand the microscopic origin of their properties. Most of such MFMs have magneto-elastic correlations. To investigate…

材料科学 · 物理学 2015-06-02 Aga Shahee , Shivani Sharma , K. Singh , N. P. Lalla , P. Chaddah

We demonstrate AFM imaging with a microcantilever force transducer where an integrated superconducting microwave resonant circuit detects cantilever deflection using the principles of cavity optomechanics. We discuss the detector…

We report the local measurements of the magnetic penetration depth $\lambda$ in a superconducting Nb film using magnetic force microscopy (MFM). We developed a method for quantitative extraction of the penetration depth from…

材料科学 · 物理学 2009-12-29 E. Nazaretski , J. P. Thibodaux , I. Vekhter , L. Civale , J. D. Thompson , R. Movshovich

Mid-infrared photo-induced force microscopy (IR-PiFM/PiF-IR) enables high-resolution chemical imaging of surfaces with lateral resolution less than 5 nm. Here are some answers to questions about the physical background, practical handling…

材料科学 · 物理学 2026-05-05 Daniela Täuber

We report on the use of 4.7-$\mu$m-diameter, optically levitated, charged microspheres to image the three-dimensional force field produced by charge distributions on an Au-coated, microfabricated Si beam in vacuum. An upward-propagating,…

仪器与探测器 · 物理学 2019-02-13 Charles P. Blakemore , Alexander D. Rider , Sandip Roy , Qidong Wang , Akio Kawasaki , Giorgio Gratta

We propose a magnetic resonance force microscopy (MRFM) search for axion dark matter around 1 GHz. The experiment leverages the axion's derivative coupling to electrons, which induces an effective A.C. magnetic field on a sample of electron…

高能物理 - 唯象学 · 物理学 2026-02-02 Elham Kashi , Muhammad Hani Zaheer , Ryan Petery , Swati Singh

Atomic force microscope (AFM) generally works on the basis of manipulating absolute magnitude of van der Waals (vdW) force between the tip and specimen. The force is, however, less sensitive to alternation of atom species than to tip-sample…

光学 · 物理学 2023-10-20 Han Yu-Xiao , Bai Benfeng , Zhang Jian-Yu , Huang Jia-Tai , Feng Peng-Yi , Sun Hong-Bo

We report a Kelvin probe force microscopy (KPFM) implementation using the dissipation signal of a frequency modulation atomic force microscopy that is capable of detecting the gradient of electrostatic force rather than electrostatic force.…

介观与纳米尺度物理 · 物理学 2017-04-21 Yoichi Miyahara , Peter Grutter

In the present work, we report on the in situ magnetic force microscopy (MFM) study of the magnetization reversal in two-dimensional arrays of ferromagnetic Ni80Fe20 and Co55Fe45 nanowires(NW) with different diameters (40, 50, 70 and 100…

材料科学 · 物理学 2013-12-03 M. R. Tabasum , F. Zighem , J. De La Torre Medina , A. Encinas , L. Piraux , B. Nysten

We present a multi-purpose mirror furnace designed for synchrotron X-ray experiments. The furnace is optimized specifically for dark-field X-ray microscopy (DFXM) of crystalline materials at the beamline ID06 of the ESRF. The furnace can…

We have developed an absolute magnetic field sensor using Superconducting Quantum Interference Filter (SQIF) made of high-T_c grain boundary Josephson junctions. The device shows the typical magnetic field dependent voltage response V(B),…

超导电性 · 物理学 2007-05-23 P. Caputo , J. Oppenlaender , Ch. Haeussler , J. Tomes , A. Friesch , T. Traeuble , N. Schopohl

Microwave impedance microscopy (MIM) is a near-field imaging technique that has been used to visualize the local conductivity of materials with nanoscale resolution across the GHz regime. In recent years, MIM has shown great promise for the…

应用物理 · 物理学 2023-10-03 Leonard Weihao Cao , Chen Wu , Rajarshi Bhattacharyya , Ruolun Zhang , Monica T. Allen

Using a Magnetic Resonace Force Microscope, we have performed ferromagnetic resonance (FMR) spectroscopy on parametric magnons created by 4-wave process. This is achieved by measuring the differential response to a small source modulation…

A photonic force microscope comprises of an optically trapped micro-probe and a position detection system to track the motion of the probe. Signal collection for motion detection is often carried out using the backscattered light off the…

仪器与探测器 · 物理学 2015-05-28 Sambit Bikas Pal , Arijit Haldar , Basudev Roy , Ayan Banerjee

We present a design for a tunneling-current-assisted scanning near-field microwave microscope. For stable operation at cryogenic temperatures, making a small and rigid microwave probe is important. Our coaxial resonator probe has a length…

介观与纳米尺度物理 · 物理学 2016-06-13 Hideyuki Takahashi , yoshinori imai , Atsutaka Maeda

We present the design and experimental results of a near-field scanning microwave microscope (NSMM) working at a frequency of 1GHz. Our microscope is unique in that the sensing probe is separated from the excitation electrode to…

材料科学 · 物理学 2009-11-13 K. Lai , M. B. Ji , N. Leindecker , M. A. Kelly , Z. X. Shen

We propose a magnetic resonance force microscopy (MRFM)-based nuclear spin quantum computer using tellurium impurities in silicon. This approach to quantum computing combines the well-developed silicon technology with expected advances in…

量子物理 · 物理学 2009-11-06 G. P. Berman , G. D. Doolen , V. I. Tsifrinovich

Torque magnetometry is a key method to measure the magnetic anisotropy and quantum oscillations in metals. In order to resolve quantum oscillations in sub-millimeter sized samples, piezo-electric micro-cantilevers were introduced. In the…

仪器与探测器 · 物理学 2018-02-08 Frank Arnold , Marcel Naumann , Thomas Lühmann , Andrew P. Mackenzie , Elena Hassinger