相关论文: Automated and Scalable SEM Image Analysis of Perov…
Segmentation and analysis of individual pores and grains of mudrocks from scanning electron microscope images is non-trivial because of noise, imaging artifacts, variation in pixel grayscale values across images, and overlaps in grayscale…
Perovskite solar cells (PSCs) have experienced a remarkable rise in power conversion efficiency (PCE) over the past 15 years, positioning them as a promising alternative or complement to silicon for large-scale photovoltaic deployment.…
This paper presents a non-invasive approach to estimate the layer thicknesses of perovskite solar cells. The thicknesses are predicted by a convolutional neural network that leverages the external quantum efficiency of a perovskite solar…
In the domain of battery research, the processing of high-resolution microscopy images is a challenging task, as it involves dealing with complex images and requires a prior understanding of the components involved. The utilization of deep…
Precise segmentation of irregular and densely arranged components is essential for robotic disassembly and material recovery in electronic waste (e-waste) recycling. This study evaluates the impact of model architecture and scale on…
Next-generation low-cost semiconductors such as halide perovskites exhibit optoelectronic properties dominated by nanoscale variations in their structure, composition and photophysics. While microscopy provides a proxy for ultimate device…
Integrated silicon photonic devices, which manipulate light to transmit and process information on a silicon-on-insulator chip, are highly sensitive to structural variations. Minor deviations during nanofabrication-the precise process of…
Accelerating the experimental cycle for new materials development is vital for addressing the grand energy challenges of the 21st century. We fabricate and characterize 75 unique halide perovskite-inspired solution-based thin-film materials…
The efficiency and stability of halide perovskite-based solar cells and light-emitting diodes directly depend on the intricate dynamics of solid-solid crystallization[1-23]. In this study, we employ a multi-scale approach using random phase…
Accurate optical constants are essential for modelling light propagation, absorption, and ultimately photovoltaic performance in state of the art perovskite solar cells and is especially important for multiple junction or tandem cells.…
We consider a series of image segmentation methods based on the deep neural networks in order to perform semantic segmentation of electroluminescence (EL) images of thin-film modules. We utilize the encoder-decoder deep neural network…
Plan-view transmission electron microscopy (TEM) samples are key to understand the atomic structure and associated properties of materials along their growth orientation, especially for thin films that are stain-engineered onto different…
With rapidly growing photoconversion efficiencies, hybrid perovskite solar cells have emerged as promising contenders for next generation, low-cost photovoltaic technologies. Yet, the presence of nanoscale defect clusters, that form during…
Metal halide perovskites exhibit coupled electronic and ionic properties that determine their photovoltaic performance and operational stability. Understanding and quantifying ionic transport are therefore essential for advancing perovskite…
Metal halide perovskite solar cells have gained widespread attention due to their high efficiency and high defect tolerance. The absorbing perovskite layer is as a mixed electron-ion conductor that supports high rates of ion and charge…
High resolution electroluminescence (EL) images captured in the infrared spectrum allow to visually and non-destructively inspect the quality of photovoltaic (PV) modules. Currently, however, such a visual inspection requires trained…
Atom segmentation and localization, noise reduction and deblurring of atomic-resolution scanning transmission electron microscopy (STEM) images with high precision and robustness is a challenging task. Although several conventional…
A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical…
Controlling defects in semiconductor processes is important for maintaining yield, improving production cost, and preventing time-dependent critical component failures. Electron beam-based imaging has been used as a tool to survey wafers in…
Four-dimensional scanning transmission electron microscopy (4D-STEM) provides rich, atomic-scale insights into materials structures. However, extracting specific physical properties - such as polarization directions essential for…