相关论文: Semiconductor SEM Image Defect Classification Usin…

Machine-vision-based defect classification techniques have been widely adopted for automatic quality inspection in manufacturing processes. This article describes a general framework for classifying defects from high volume data batches…

Hybrid quantum-classical machine learning offers a promising direction for advancing automated quality control in industrial settings. In this study, we investigate two hybrid quantum-classical approaches for classifying defects in…

A generic fast method for object classification is proposed. In addition, a method for dimensional reduction is presented. The presented algorithms have been applied to real-world data from chip fabrication successfully to the task of…

The alignment of serial-section electron microscopy (ssEM) images is critical for efforts in neuroscience that seek to reconstruct neuronal circuits. However, each ssEM plane contains densely packed structures that vary from one section to…

In the field of medical imaging, the advent of deep learning, especially the application of convolutional neural networks (CNNs) has revolutionized the analysis and interpretation of medical images. Nevertheless, deep learning methods…

The past few years have witnessed vibrant efforts in discovering new two-dimensional (2D) semiconductor materials from both academia and the industry, due to their promising potential in resolving the severe performance deterioration of…

Side-scan sonar (SSS) imagery presents unique challenges in the classification of man-made objects on the seafloor due to the complex and varied underwater environments. Historically, experts have manually interpreted SSS images, relying on…

In recent years, the scientific community has focused on the development of CAD tools that could improve bone fractures' classification, mostly based on Convolutional Neural Network (CNN). However, the discerning accuracy of fractures'…

Major advancements in computer vision can primarily be attributed to the use of labeled datasets. However, acquiring labels for datasets often results in errors which can harm model performance. Recent works have proposed methods to…

One of the most promising use-cases for machine learning in industrial manufacturing is the early detection of defective products using a quality control system. Such a system can save costs and reduces human errors due to the monotonous…

This work tackles the problem of semi-supervised learning of image classifiers. Our main insight is that the field of semi-supervised learning can benefit from the quickly advancing field of self-supervised visual representation learning.…

Material properties strongly depend on the nature and concentration of defects. Characterizing these features may require nano- to atomic-scale resolution to establish structure-property relationships. 4D-STEM, a technique where diffraction…

Deep convolutional neural networks have achieved remarkable progress on a variety of medical image computing tasks. A common problem when applying supervised deep learning methods to medical images is the lack of labeled data, which is very…

In recent years, Artificial Neural Networks (ANNs) have been introduced in Structural Health Monitoring (SHM) systems. A semi-supervised method with a data-driven approach allows the ANN training on data acquired from an undamaged…

Exploring the trustworthiness of deep learning models is crucial, especially in critical domains such as medical imaging decision support systems. Conformal prediction has emerged as a rigorous means of providing deep learning models with…

The development of X-Ray microscopy (XRM) technology has enabled non-destructive inspection of semiconductor structures for defect identification. Deep learning is widely used as the state-of-the-art approach to perform visual analysis…

Skin cancer is a global health concern, necessitating early and accurate diagnosis for improved patient outcomes. This study introduces a groundbreaking approach to skin cancer classification, employing the Vision Transformer, a…

Overhead line inspection greatly benefits from defect recognition using visible light imagery. Addressing the limitations of existing feature extraction techniques and the heavy data dependency of deep learning approaches, this paper…

Semi-Supervised image classification is one of the most fundamental problem in computer vision, which significantly reduces the need for human labor. In this paper, we introduce a new semi-supervised learning algorithm - SimMatchV2, which…

We propose a semi-supervised network for wide-angle portraits correction. Wide-angle images often suffer from skew and distortion affected by perspective distortion, especially noticeable at the face regions. Previous deep learning based…