相关论文: Defect Detection in Photolithographic Patterns Usi…
Efficient quality control is inevitable in the manufacturing of light-emitting diodes (LEDs). Because defective LED chips may be traced back to different causes, a time and cost-intensive electrical and optical contact measurement is…
Object detection is crucial in various cutting-edge applications, such as autonomous vehicles and advanced robotics systems, primarily relying on data from conventional frame-based RGB sensors. However, these sensors often struggle with…
Understanding elementary mechanisms behind solid-state phase transformations and reactions is the key to optimizing desired functional properties of many technologically relevant materials. Recent advances in scanning transmission electron…
Existing detection methods for insulator defect identification from unmanned aerial vehicles (UAV) struggle with complex background scenes and small objects, leading to suboptimal accuracy and a high number of false positives detection.…
This study addresses the demand for real-time detection of tomatoes and tomato flowers by agricultural robots deployed on edge devices in greenhouse environments. Under practical imaging conditions, object detection systems often face…
Photovoltaic (PV) systems allow us to tap into all abundant solar energy, however they require regular maintenance for high efficiency and to prevent degradation. Traditional manual health check, using Electroluminescence (EL) imaging, is…
This paper addresses the synthetic-to-real domain gap in object detection, focusing on training a YOLOv11 model to detect a specific object (a soup can) using only synthetic data and domain randomization strategies. The methodology involves…
With the continuous advancement of industrial automation, product quality inspection has become increasingly important in the manufacturing process. Traditional inspection methods, which often rely on manual checks or simple machine vision…
Due to potential pitch reduction, the semiconductor industry is adopting High-NA EUVL technology. However, its low depth of focus presents challenges for High Volume Manufacturing. To address this, suppliers are exploring thinner…
While one-stage detectors like YOLOv8 offer fast training speed, they often under-perform on detecting small objects as a trade-off. This becomes even more critical when detecting tiny objects in aerial imagery due to low-resolution targets…
With the rapid growth in the semiconductor industry, it is becoming critical to detect and classify increasingly smaller patterned defects. Recently machine learning, including deep learning, has come to aid in this endeavor in a big way.…
Visual quality inspection in high performance manufacturing can benefit from automation, due to cost savings and improved rigor. Deep learning techniques are the current state of the art for generic computer vision tasks like classification…
As the development of atom scale devices transitions from novel, proof-of-concept demonstrations to state-of-the-art commercial applications, automated assembly of such devices must be implemented. Here we present an automation method for…
We aim at constructing a high performance model for defect detection that detects unknown anomalous patterns of an image without anomalous data. To this end, we propose a two-stage framework for building anomaly detectors using normal…
With the accelerating pace of digital transformation and the widespread adoption of online platforms, both social and technical concerns regarding dark patterns-user interface designs that undermine users' ability to make informed and…
Anomaly detection refers to the task of finding unusual instances that stand out from the normal data. In several applications, these outliers or anomalous instances are of greater interest compared to the normal ones. Specifically in the…
Ensuring the structural integrity and safety of bridges is crucial for the reliability of transportation networks and public safety. Traditional crack detection methods are increasingly being supplemented or replaced by advanced artificial…
From a process development perspective, diamond growth via chemical vapor deposition has made significant strides. However, challenges persist in achieving high quality and large-area material production. These difficulties include…
In this review, automatic defect inspection algorithms that analyze Scanning Electron Microscopy (SEM) images for Semiconductor Manufacturing (SM) are identified, categorized, and discussed. This is a topic of critical importance for the SM…
Efficient automated print defect mapping is valuable to the printing industry since such defects directly influence customer-perceived printer quality and manually mapping them is cost-ineffective. Conventional methods consist of…