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This paper introduces a software architecture for real-time object detection using machine learning (ML) in an augmented reality (AR) environment. Our approach uses the recent state-of-the-art YOLOv8 network that runs onboard on the…

计算机视觉与模式识别 · 计算机科学 2023-06-07 Mikołaj Łysakowski , Kamil Żywanowski , Adam Banaszczyk , Michał R. Nowicki , Piotr Skrzypczyński , Sławomir K. Tadeja

With the increasing use of plastic, the challenges associated with managing plastic waste have become more challenging, emphasizing the need of effective solutions for classification and recycling. This study explores the potential of deep…

计算机视觉与模式识别 · 计算机科学 2024-12-31 Suman Kunwar , Banji Raphael Owabumoye , Abayomi Simeon Alade

Automated surface-anomaly detection using machine learning has become an interesting and promising area of research, with a very high and direct impact on the application domain of visual inspection. Deep-learning methods have become the…

计算机视觉与模式识别 · 计算机科学 2019-06-12 Domen Tabernik , Samo Šela , Jure Skvarč , Danijel Skočaj

Within the field of robotics, computer vision remains a significant barrier to progress, with many tasks hindered by inefficient vision systems. This research proposes a generalized vision module leveraging YOLOv9, a state-of-the-art…

机器人学 · 计算机科学 2025-10-16 Nicolas Pottier , Meng Cheng Lau

Ensuring the structural integrity and safety of bridges is crucial for the reliability of transportation networks and public safety. Traditional crack detection methods are increasingly being supplemented or replaced by advanced artificial…

计算机视觉与模式识别 · 计算机科学 2025-05-30 Woubishet Zewdu Taffese , Ritesh Sharma , Mohammad Hossein Afsharmovahed , Gunasekaran Manogaran , Genda Chen

Roads are connecting line between different places, and used daily. Roads' periodic maintenance keeps them safe and functional. Detecting and reporting the existence of potholes to responsible departments can help in eliminating them. This…

计算机视觉与模式识别 · 计算机科学 2021-07-15 Anas Al Shaghouri , Rami Alkhatib , Samir Berjaoui

In this research work, we have demonstrated the application of Mask-RCNN (Regional Convolutional Neural Network), a deep-learning algorithm for computer vision and specifically object detection, to semiconductor defect inspection domain.…

计算机视觉与模式识别 · 计算机科学 2022-11-07 Bappaditya Dey , Enrique Dehaerne , Kasem Khalil , Sandip Halder , Philippe Leray , Magdy A. Bayoumi

Recent years have witnessed the advancement of deep learning vision technologies and applications in the medical industry. Intelligent devices for special medication management are in great need of, which requires more precise detection…

计算机视觉与模式识别 · 计算机科学 2021-10-20 Jiao Peng , Feifan Wang , Zhongqiang Fu , Yiying Hu , Zichen Chen , Xinghan Zhou , Lijun Wang

As solar capacity installed worldwide continues to grow, there is an increasing awareness that advanced inspection systems are becoming of utmost importance to schedule smart interventions and minimize downtime likelihood. In this work we…

计算机视觉与模式识别 · 计算机科学 2022-04-06 Antonio Di Tommaso , Alessandro Betti , Giacomo Fontanelli , Benedetto Michelozzi

In this paper, we introduce the problem of simultaneously detecting multiple photographic defects. We aim at detecting the existence, severity, and potential locations of common photographic defects related to color, noise, blur and…

计算机视觉与模式识别 · 计算机科学 2018-03-09 Ning Yu , Xiaohui Shen , Zhe Lin , Radomir Mech , Connelly Barnes

This study provides a comprehensive analysis of the YOLOv9 object detection model, focusing on its architectural innovations, training methodologies, and performance improvements over its predecessors. Key advancements, such as the…

计算机视觉与模式识别 · 计算机科学 2024-09-13 Muhammad Yaseen

We envision that in the near future, humanoid robots would share home space and assist us in our daily and routine activities through object manipulations. One of the fundamental technologies that need to be developed for robots is to…

计算机视觉与模式识别 · 计算机科学 2020-02-11 Sayantan Chatterjee , Faheem H. Zunjani , Souvik Sen , Gora C. Nandi

The quality control of printed circuit boards (PCBs) is paramount in advancing electronic device technology. While numerous machine learning methodologies have been utilized to augment defect detection efficiency and accuracy, previous…

机器学习 · 计算机科学 2024-09-17 Ka Nam Canaan Law , Mingshuo Yu , Lianglei Zhang , Yiyi Zhang , Peng Xu , Jerry Gao , Jun Liu

This survey paper offers a comprehensive review of methodologies utilizing machine learning (ML) classification techniques for identifying wafer defects in semiconductor manufacturing. Despite the growing body of research demonstrating the…

机器学习 · 计算机科学 2024-03-21 Kamal Taha

X-ray image plays an important role in manufacturing industry for quality assurance, because it can reflect the internal condition of weld region. However, the shape and scale of different defect types vary greatly, which makes it…

计算机视觉与模式识别 · 计算机科学 2021-11-19 Moyun Liu , Youping Chen , Lei He , Yang Zhang , Jingming Xie

This study addresses the demand for real-time detection of tomatoes and tomato flowers by agricultural robots deployed on edge devices in greenhouse environments. Under practical imaging conditions, object detection systems often face…

图像与视频处理 · 电气工程与系统科学 2026-02-02 Hung-Chih Tu , Bo-Syun Chen , Yun-Chien Cheng

Visual defect detection is critical to ensure the quality of most products. However, the majority of small and medium-sized manufacturing enterprises still rely on tedious and error-prone human manual inspection. The main reasons include:…

计算机视觉与模式识别 · 计算机科学 2022-02-15 Zijian Kuang , Xinran Tie , Lihang Ying , Shi Jin

Although accuracy and other common metrics can provide a useful window into the performance of an object detection model, they lack a deeper view of the model's decision process. Regardless of the quality of the training data and process,…

计算机视觉与模式识别 · 计算机科学 2024-01-22 Lynn Vonder Haar , Timothy Elvira , Luke Newcomb , Omar Ochoa

Tremendous progress has been made on face detection in recent years using convolutional neural networks. While many face detectors use designs designated for detecting faces, we treat face detection as a generic object detection task. We…

计算机视觉与模式识别 · 计算机科学 2022-01-28 Delong Qi , Weijun Tan , Qi Yao , Jingfeng Liu

Due to potential pitch reduction, the semiconductor industry is adopting High-NA EUVL technology. However, its low depth of focus presents challenges for High Volume Manufacturing. To address this, suppliers are exploring thinner…

计算机视觉与模式识别 · 计算机科学 2024-04-10 Ying-Lin Chen , Jacob Deforce , Vic De Ridder , Bappaditya Dey , Victor Blanco , Sandip Halder , Philippe Leray